A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory

Abstract A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in laboratory is described. The results of Single Event Latchup (SEL) test on two VLSI chips (VA_HDR64, 0.8 and 1.2 μm technology) are discussed and compared to those obtained with high-energy heavy ions at GSI (Darmstadt)

SMART- Small Motor AerRospace Technology

European Space Agency, (Special Publication) ESA SP A. 2004, n° 571, pp. 379-38