Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE

We report ultra-high responsivity of epitaxial (SnxGa1-x)2O3 (TGO) Schottky UV-C photodetectors and experimentally identified the source of gain as deep-level defects, supported by first principles calculations. Epitaxial TGO films were grown by plasma-assisted molecular beam epitaxy on (-201) oriented n-type β-Ga2O3 substrates. Fabricated vertical Schottky devices exhibited peak responsivities as high as 3.5×104 A/W at -5V applied bias under 250nm illumination with sharp cutoff shorter than 280nm and fast rise/fall time in milliseconds order. Hyperspectral imaging cathodoluminescence (CL) spectra were examined to find the mid-bandgap defects, the source of this high gain. Irrespective of different tin mole fractions, the TGO epilayer exhibited extra CL peaks at the green band (2.20 eV) not seen in β-Ga2O3 along with enhancement of the blue emission-band (2.64 eV) and suppression of the UV emission-band. Based on hybrid functional calculations of the optical emission expected for defects involving Sn in β-Ga2O3, VGa–Sn complexes are proposed as potential defect origins of the observed green and blue emission-bands. Such complexes behave as acceptors that can efficiently trap photogenerated holes and are predicted to be predominantly responsible for the ultra-high photoconductive gain in the Sn-alloyed Ga2O3 devices by means of thermionic emission and electron tunneling. Regenerating the VGa–Sn defect complexes by optimizing the growth techniques, we have demonstrated a planar Schottky UV-C photodetector of the highest peak responsivity

Broad luminescence from Zn acceptors in Zn doped β-Ga2O3

Zn-related defects in β-Ga2O3 were studied using photoluminescence (PL) spectroscopy combined with hybrid functional calculations and secondary ion mass spectrometry. We have in-diffused Zn by heat treatments of β-Ga2O3 in Zn vapor to promote the formation of the ZnGaZni complex as the dominating Zn configuration. Subsequently, we did heat treatment in oxygen ambient to study the dissociation of the donor complex ZnGaZni into the ZnGa acceptor. The PL spectra revealed a broad band centered at 2.5 eV. The signature has a minor contribution to the overall emission of as-grown and Zn-annealed samples but increases dramatically upon the subsequent heat treatments. The theoretical predictions from hybrid functional calculation show emission energies of 2.1 and 2.3 eV for ZnGa10/− and ZnGa20/−, respectively, and given that the previously observed deviation between the experimental and calculated values for the self-trapped holes in β-Ga2O3 is about 0.2 eV, we conclude that the 2.5 eV emission we observe herein is due to the Zn acceptor

Electrical charge state identification and control for the silicon vacancy in 4H-SiC

Reliable single-photon emission is crucial for realizing efficient spin-photon entanglement and scalable quantum information systems. The silicon vacancy (VSi) in 4H-SiC is a promising single-photon emitter exhibiting millisecond spin coherence times, but suffers from low photon counts, and only one charge state retains the desired spin and optical properties. Here, we demonstrate that emission from VSi defect ensembles can be enhanced by an order of magnitude via fabrication of Schottky barrier diodes, and sequentially modulated by almost 50% via application of external bias. Furthermore, we identify charge state transitions of VSi by correlating optical and electrical measurements, and realize selective population of the bright state. Finally, we reveal a pronounced Stark shift of 55 GHz for the V1′ emission line state of VSi at larger electric fields, providing a means to modify the single-photon emission. The approach presented herein paves the way towards obtaining complete control of, and drastically enhanced emission from, VSi defect ensembles in 4H-SiC highly suitable for quantum applications

Diffusion of Sn donors in β-Ga2O3

Diffusion of the n-type dopant Sn in β-Ga2O3 is studied using secondary-ion mass spectrometry combined with hybrid functional calculations. The diffusion of Sn from a Sn-doped bulk substrate with surface orientation (001) into an epitaxial layer is observed after heat treatments in the temperature range of 1050–1250 °C. Calculated formation energies of Sn-related and intrinsic defects show that the migration of Sn is mediated by Ga vacancies (VGa) through the formation and dissociation of intermittent mobile VGaSnGa complexes. The evolution of the Sn concentration vs depth profiles after heat treatments can be well described by a reaction–diffusion model. Using model parameters guided by the hybrid functional calculations, we extract a VGaSnGa complex migration barrier of 3.0 ± 0.4 eV with a diffusion coefficient of 2 × 10−1 cm2/s. The extracted migration barrier is consistent with our theoretical predictions using the nudged elastic band method, which shows migration barriers of 3.42, 3.15, and 3.37 eV for the [100], [010], and [001] directions, respectively