Microstructural and mechanical analysis on Cu-Sn intermetallic micro-joints under isothermal condition

This study focuses on the mechanism of phase transformation from Cu6Sn5 into Cu3Sn and the homogenization process in full intermetallics (IMCs) micro-joints, which were prepared by soldering the initial Cu/Sn/Cu structure through high temperature storage in vacuum environment as the Transient Liquid Phase (TLP) process. From the microstructural observation by electron backscatter diffraction (EBSD), a mixture of IMCs phases (Cu6Sn5 and Cu3Sn) has been found to constitute the sandwich-structured Cu/IMCs/Cu joints. With the dwell time increasing at 533 K, there were two layers of Cu3Sn emerging from both sides of copper substrates with the depletion of Cu6Sn5 layer, toward merging each other in the IMCs interlayer. Then the Cu3Sn grains with various sizes became more homogenous columnar crystallites. Meanwhile, some equiaxial ultra-fine grains accompanied with the Kirkendall voids, were found only in adjacent to the electroplated copper. In addition, a specific type of micropillar with the size ∼5 μm × 5 μm × 12 μm fabricated by focus ion beam (FIB) was used to carry out the mechanical testing by Nano-indentation, which confirmed that this type of joint is mechanically robust, regardless of its porous Cu3Sn IMC interconnection

Microstructures and properties of new Sn-Ag-Cu lead-free solder reinforced with Ni-coated graphene nanosheets

© 2015 Elsevier B.V. All rights reserved. This paper deals with microstructures and properties of SAC305 lead-free solder reinforced with graphene nanosheets (GNS) decorated with Ni nanoparticles (Ni-GNS). These Ni-coated GNS nanosheets were synthesized by an in-situ chemical reduction method. After morphological and chemical characterization, Ni-GNS were successfully integrated into SAC305 lead-free solder alloy with different weight fractions (0, 0.05, 0.1 and 0.2 wt.%) through a powder metallurgy route. The obtained composite solders were then studied extensively with regard to their microstructures, wettability, thermal, electrical and mechanical properties. After addition of Ni-GNSs, cauliflower-like (Cu,Ni)6 Sn5 intermetallic compounds (IMCs) were formed at the interface between composite solder joint and copper substrate. Additionally, blocky Ni-Sn-Cu IMC/GNS hybrids were also observed homogenously distributed in the composite solder matrices. Composite solder alloys incorporating Ni-decorated GNSs nanosheets showed slightly reduced electrical resistivity compared to the unreinforced SAC305 solder alloy. With an increase in the amount of Ni-GNS, the composite solders showed an improvement in wettability with an insignificant change in their melting temperature. Mechanical tests demonstrated that addition of 0.2 wt.% Ni-GNS would result in 19.7% and 16.9% improvements in microhardness and shear strength, respectively, in comparison to the unreinforced solders. Finally, the added Ni-GNS reinforcements in the solder matrix were assessed with energy-dispersive X-ray spectroscopy, scanning electron microscopy and Raman spectroscopy

Formation and homogenisation of Sn-Cu interconnects by self-propagated exothermic reactive bonding

We produced SnCu interconnects by self-propagated exothermic reactions using AlNi NanoFoil at ambient conditions, through the instantaneous localised heat across the interfaces between Sn electroplated Cu substrates. This technique presents a great potential for electronics integration with minimal thermal effects to the components. However, the metastable phases resulted from the non-equilibrium interfacial reactions and solidification were inevitable under a highly transient regime due to a drastic heating/cooling (over 107 K/s). In this study, Finite Element Analysis was performed to predict the temperature profiles across bonding interfaces, which were subsequently correlated with the formation and homogenisation of the bonded structures during the bonding and post-bonding ageing process. It has been revealed that, for nano-sized metastable phases, their formation, morphologies and distribution were primarily attributed to the convective mass transportation, liquid-solid inter-diffusion, and directional non-equilibrium solidification of Sn in molten zone of the bonding interfaces. The non-equilibrium phases initially formed in the SnCu interconnects can be homogenised towards the equilibrium status by accelerated ageing. This was achieved through the coalescing and subsequent growth of the original nano-sized metastable phases, as a result of the solid-diffusion of Cu and Ag atoms at intergranular boundary regions of Sn grains, AlNi NanoFoil/Sn. and Cu/Sn interfaces

Microstructural evolution of Cu–Sn–Ni compounds in full intermetallic micro-joint and in situ micro-bending test

This study focuses on the microstructural evolution process of Cu–Sn–Ni intermetallic compounds (IMCs) interlayer in the micro-joints, formed from the initial Ni/Sn (1.5 µm)/Cu structure through transient liquid phase (TLP) soldering. Under the bonding temperature of 240 °C, the micro-joints evolve into Ni/(Cu, Ni)6Sn5/(Cu, Ni)3Sn/Cu structure, where the interfacial reactions on Cu/Sn and Sn/Ni are suppressed by the atoms diffusing from the opposite side. The thickness of (Cu, Ni)3Sn layer on plated Cu layer still increases with the prolonged dwell time. When the bonding temperature was elevated to 290 °C, the phase transformation of (Cu, Ni)6Sn5 into (Cu, Ni)3Sn has been accelerated, thus the majority of IMCs interlayer is constituted with (Cu, Ni)3Sn. However, a small amount of Ni-rich (Cu, Ni)6Sn5 phases still remain near the Ni substrate and some of them close to the center-line of IMCs interlayer. The state between (Cu, Ni)6Sn5 and the adjacent (Cu, Ni)3Sn tends to reach equilibrium in Ni content based on the observation from Transmission Electron Microscope (TEM). In addition, the Cu–Sn–Ni IMCs micro-cantilevers were fabricated from these micro-joints using Focus Ion Beam (FIB) for the in situ micro-bending test, the results indicate a high ultimate tensile strength as well as the brittle fracture in the inter- and transgranular modes

Retained ratio of reinforcement in SAC305 composite solder joints: effect of reinforcement type, processing and reflow cycle

Purpose This paper aims to systematically study the effect of reinforcement type, processing methods and reflow cycle on actual retained ratio of foreign reinforcement added in solder joints. Design/methodology/approach Two kinds of composite solders based on SAC305 (wt.%) alloys with reinforcements of 1 wt.% Ni and 1 wt.% TiC nano-particles were produced using powder metallurgy and mechanical blending method. The morphology of prepared composite solder powder and solder pastes was examined; retained ratios of reinforcement (RRoR) added in solder joints after different reflow cycles were analysed quantitatively using an Inductively Coupled Plasma optical system (ICP-OES Varian-720). The existence forms of reinforcement added in solder alloys during different processing stages were studied using scanning electron microscope, X-ray diffractometry and energy dispersive spectrometry. Findings The obtained experimental results indicated that the RRoR in composite solder joints decreased with the increase in the number of reflow cycles, but a loss ratio diminished gradually. It was also found that the RRoR which could react with the solder alloy were higher than that of the one that are unable to react with the solder. In addition, compared with mechanical blending, the RRoRs in the composite solders prepared using power metallurgy were relatively pronounced. Originality/value Present study offer a preliminary understanding on actual content and existence form of reinforcement added in a reflowed solder joint, which would also provide practical implications for choosing reinforcement and adjusting processing parameters in the manufacture of composite solders

Performance of Sn–3.0Ag–0.5Cu composite solder with TiC reinforcement: physical properties, solderability and microstructural evolution under isothermal ageing

This paper is focused on the effect of TiC nano-reinforcement that was successfully introduced into a SAC305 lead-free solder alloy with different weight fractions (0, 0.05, 0.1 and 0.2 wt%) through a powder-metallurgy route. Actual retained ratios of TiC reinforcement in composite solder billets and solder joints were quantitatively analysed. The obtained SAC/TiC solders were also studied extensively with regard to their coefficient of thermal expansion (CTE), wettability and thermal properties. In addition, evolution of interfacial intermetallic compounds (IMCs) and corresponding changes in mechanical properties under thermal ageing were investigated. Only about 10%–30% of initial TiC nanoparticles added were found retained in the final composite solder joints. With an appropriate addition amount of TiC nanoparticles, the composite solders exhibited an improvement in their wettability. A negligible change in their melting point and a widened melting range were found in composite solders containing TiC reinforcement. Also, the CTE of composite solder alloys was effectively decreased when compared with the plain SAC solder alloy. In addition, a growth of interfacial IMCs in composite solder joints was notably suppressed under isothermal ageing condition, while their corresponding mechanical properties of composite solder joints significantly outperformed those of non-reinforced solder joints throughout the ageing period

Diffusion barrier property of electroless Ni-W-P coating in high temperature Zn-5Al/Cu solder interconnects

The operating temperature of high-temperature electronics can significantly promote the growth of intermetallic compounds (IMCs) at solder/substrate interfaces, particularly for low-cost Zn-based solders because of the rapid rate of reaction of Zn with Cu. Thus, a reliable and robust diffusion barrier is indispensable for suppressing the reactions between solder and substrate. In this work, a ternary Ni-W-P alloy was prepared via electroless plating. Its diffusion barrier property was evaluated by comparing the microstructures of IMC layers in Zn-5Al/Ni-W-P/Cu and Zn-5Al/Cu interconnects after liquid-solid reaction for prolonged durations. When the reaction lasted for 30 min, the thickness of the Al3Ni2 produced in the Zn-5Al/Ni-W-P/Cu solder interconnects was only 2.15 μm, whereas the thickness of the interfacial layer of Cu-Zn IMCs (CuZn4, Cu5Zn8 and CuZn) at the Zn-5Al/Cu interface was 94 μm. Because of the unbalanced growth of the IMCs in the Zn-5Al/Cu interconnects, notable numbers of Kirkendall voids were identified at the CuZn4/Cu5Zn8, Cu5Zn8/CuZn and CuZn/Cu interfaces after prolonged liquid-solid reaction. By contrast, the Al3Ni2 layer in the Zn-5Al/Ni-W-P/Cu solder joints remained intact, showing the potential to effectively enhance the mechanical reliability of electronic devices

Microstructural evolution of 96.5Sn–3Ag–0.5Cu lead free solder reinforced with nickel-coated graphene reinforcements under large temperature gradient

In this study, 96.5Sn–3Ag–0.5Cu (SAC305) lead-free composite solder containing graphene nanosheets (GNS) decorated with Ni nanoparticles (Ni-GNS) was prepared using a powder metallurgy method. A lab-made set-up and a corresponding Cu/solder/Cu sample design for assessing thermo-migration (TM) was established. The feasibility of this setup for TM stressing using an infrared thermal imaging method was verified; a temperature gradient in a solder joint was observed at 1240 K/cm. Microstructural evolution and diffusion of Cu in both plain and composite solder joints were then studied under TM stressing conditions. Compared to unreinforced SAC305 solder, the process of diffusion of Cu atoms in the composite solder joint was significantly reduced. The interfacial intermetallic compounds (IMCs) present in the composite solder joint also provide a more stable morphology after the TM test for 600 h. Furthermore, during the TM test, the Ni-GNS reinforcement affects the formation, migration and distribution of Ni–Cu–Sn and Cu–Sn IMCs by influencing the dissolution rate of Cu atoms

Thermo-migration behavior of SAC305 lead-free solder reinforced with fullerene nanoparticles

In this work, SAC305 lead-free solder reinforced with 0.1 wt. % fullerene nanoparticles was prepared using a powder metallurgy method. A lab-made setup and a corresponding Cu/solder/Cu sample for thermo-migration (TM) test were designed and implemented. The feasibility of this setup for TM stressing was further verified with experimental and simulation methods; a temperature gradient in a solder seam was calculated as 1070 K/cm. Microstructural evolution and mechanical properties of both plain and composite solder alloys were then studied under the condition of TM stressing. It was shown that compared to unreinforced SAC305 solder, the process of diffusion of Cu atoms in the composite solder seam was remarkably suppressed. After the TM test for 600 h, Cu/solder interfaces in the composite solder seam were more stable and the inner structure remained more intact. Moreover, the addition of fullerene reinforcement can considerably affect a distribution of Cu6Sn5 formed as a result of dissolution of Cu atoms during the TM test. Hardness data across the solder seam were also found notably different because of the elemental redistribution caused by TM

Novel processes to enable deposition of metal coated polymer micro-spheres for flip-chip interconnections

Electronics packaging with Anisotropic Conductive Adhesives (ACAs) has been successfully implemented in flat screen assembly and smart cards for more than two decades, but novel processes are required to enable any significant further increases in interconnection density. This paper will report work to further develop two promising methods which can potentially extend the application of the types of conductor particles used in ACAs to enable ultra-fine pitch interconnections by selectively depositing these metal-coated polymer particles onto targeted bond pads. These two methods are electrophoretic deposition (EPD) and magnetic deposition (MD). To allow EPD the particles were positively charged by being immersed in a HCl solution, and then were selectively deposited onto the bumps on a silicon test chip. However the HCl immersion results in etching of the nickel layer, which is believed to significantly impact the conductivity and reliability of the interconnections formed, even though a connection forms between the particles and pads which is quite strong. In the MD process the Ti/Ni/Au bond pads on the test chips were permanently magnetized so that the particles were attracted to the pads, and the results proved that a sufficient density of the Ni/Au coated polymer particles became adhered to the pads providing a simple, low cost, and ultra-fine pitch method