40 research outputs found
Special session: Operating systems under test: An overview of the significance of the operating system in the resiliency of the computing continuum
The computing continuum's actual trend is facing a growth in terms of devices with any degree of computational capability. Those devices may or may not include a full-stack, including the Operating System layer and the Application layer, or just facing pure bare-metal solutions. In either case, the reliability of the full system stack has to be guaranteed. It is crucial to provide data regarding the impact of faults at all system stack levels and potential hardening solutions to design highly resilient systems. While most of the work usually concentrates on the application reliability, the special session aims to provide a deep comprehension of the impact on the reliability of an embedded system when faults in the hardware substrate of the system stack surface at the Operating System layer. For this reason, we will cover a comparison from an application perspective when hardware faults happen in bare metal vs. real-time OS vs. general-purpose OS. Then we will go deeper within a FreeRTOS to evaluate the contribution of all parts of the OS. Eventually, the Special Session will propose some hardening techniques at the Operating System level by exploiting the scheduling capabilities
Design of a soft-error robust microprocessor
International audienceThe costs to protect a commercial microprocessor against soft errors are discussed in this work. Based on hardware and time redundancies, a protection scheme was designed at RT level to mitigate transient faults on combinational and memory circuits. A fault-tolerant IC version of a mass-produced 8-bit microprocessor is protected by the scheme. Design issues and results in area, performance and power are presented comparing the robust microprocessor with its non-protected version. The costs by flip-flop are also discussed permitting to estimate the overheads in area for any architecture. Furthermore, the RT-level protection scheme is compared with an electrical-level scheme based on a non-standard gate