Comparing powder magnetization and transport critical current of Bi,Pb(2223) tapes

The magnetic field dependence of the critical current in (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+x/ tapes is compared with the magnetization response of isolated grains extracted from the tapes. Special attention is paid to the low-field behavior. The goal of the experiment is to test the widely-used hypothesis that current paths in these tapes contain both weak- and strong- linked branches, which in low field act in parallel. The data agree with this hypothesis; at temperatures above 50 K the powder magnetization drops off exponentially from the self-field to the irreversibility field, while the transport and magnetization currents in the intact tapes show an extra low-field component. Below 50 K the powder behavior becomes less straightforward, but the parallel-path picture in the tapes still holds

Strain effects in high temperature superconductors investigated with magneto-optical imaging

In order to determine the influence of intermediate deformation steps on the mechanical behavior of Bi-based tapes, the effect of longitudinal applied strain is investigated by means of magneto-optical imaging. The strain is applied in a helium flow-cryostat. Cracks appear soon after the critical current in Bi-based tapes is degraded. All filaments form multiple cracks that grow into tape-wide cracks, running from one filament to the next. The crack location is not caused by stress concentrations in the matrix, but by the mechanically weak colony boundaries. Because of the absence of intermediate rolling steps in the production of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tapes, a different crack structure is observed compared to Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ tapes. The relation between the critical current and the formation of cracks is studied. The degradation in critical current before the critical strain is reached may be caused by microcracks that remain undetected by magneto-optical imaging. The influence of strain on the microstructure of YBa/sub 2/Cu/sub 3/O/sub x/ coated conductors is also investigated with magneto-optical imaging. The formation of cracks is believed to be determined by the nickel substrate and related to the Ni-grain size

Critical current versus strain research at the University of Twente

At the University of Twente a U-shaped spring has been used to investigate the mechanical properties of a large variety of superconducting tapes and wires. Several mechanisms are responsible for the degradation of critical current as a function of applied strain. A change in its intrinsic parameters causes a reversible critical current dependence in Nb3Sn. The critical current reaches a maximum at a wire-dependent tensile strain level, and decreases when this tensile strain is either released or further increased. In Bi-based tapes the critical current is virtually insensitive to tensile strain up to a sample-dependent irreversible strain limit. When this limit is exceeded, the critical current decreases steeply and irreversibly. This behaviour is attributed to microstructural damage to the filaments. This cracking of the filaments is verified by a magneto-optical strain experiment. Recent experiments suggest that in MgB2 the degradation of critical current is caused by a change in intrinsic properties and damage to the microstructure. Magneto-optical imaging can be used to investigate the influence of applied strain on the microstructure of MgB2, as is done successfully with Bi-based tapes. In all these conductors the thermal precompression of the filaments plays an important role. In Nb3Sn it determines the position of the maximum and in Bi-based and MgB2 conductors it is closely related to the irreversible strain limit

Limits to the critical current in Bi2Sr2Ca2Cu3Ox tape conductors: The parallel path model

An extensive overview of a model that describes current flow and dissipation in high-quality Bi2Sr2Ca2Cu3Ox superconducting tapes is provided. The parallel path model is based on a superconducting current running in two distinct parallel paths. One of the current paths is formed by grains that are connected at angles below 4°. Dissipation in this strongly linked backbone occurs within the grains and is well described by classical flux-creep theory. The other current path, the weakly linked network, is formed by superconducting grains that are connected at intermediate angles (4°–8°) where dissipation occurs at the grain boundaries. However, grain boundary dissipation in this weakly linked current path does not occur through Josephson weak links, but just as in the strongly linked backbone, is well described by classical flux creep. The results of several experiments on Bi2Sr2Ca2Cu3Ox tapes and single-grained powders that strongly support the parallel path model are presented. The critical current density of Bi2Sr2Ca2Cu3Ox tapes can be scaled as a function of magnetic field angle over the temperature range from 15 K to 77 K. Expressions based on classical flux creep are introduced to describe the dependence of the critical current density of Bi2Sr2Ca2Cu3Ox tapes on the magnetic field and temperature

Electrical and mechanical properties of Bi-2223/Ag tapes made by TIRT technique

Multi-core Bi-2223/Ag tapes with various number of filaments (21–162), different filament architecture and their changing orientation to the tape plane have been made by the tape-in-rectangular tube (TIRT) process. The transport current properties of TIRT tape samples with “parallel” and “perpendicular” filaments have been measured. The transversal Ic distribution obtained by spatially resolved transport measurements (“magnetic knife”) measurement illustrates that filament quality of TIRT tapes is better at the tape edges as in its centre. The Ic degradation due to bending shows a different behaviour for parallel and perpendicular filaments which is attributed to the difference in filament density and crack propagation

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