4 research outputs found
Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
Stacking domain boundaries occur in Van der Waals heterostacks whenever there is a twist angle or lattice mismatch between subsequent layers. Not only can these domain boundaries host topological edge states, imaging them has been instrumental to determine local variations in twisted bilayer graphene. Here, we analyse the mechanisms causing stacking domain boundary contrast in Bright Field Low-Energy Electron Microscopy (BF-LEEM) for both graphene on SiC, where domain boundaries are caused by strain and for twisted few layer graphene. We show that when domain boundaries are between the top two graphene layers, BF-LEEM contrast is observed due to amplitude contrast and corresponds well to calculations of the contrast based purely on the local stacking in the domain boundary. Conversely, for deeper-lying domain boundaries, amplitude contrast only provides a weak distinction between the inequivalent stackings in the domains themselves. However, for small domains phase contrast, where electrons from different parts of the unit cell interfere causes a very strong contrast. We derive a general rule-of-thumb of expected BF-LEEM contrast for domain boundaries in Van der Waals materials. Quantum Matter and Optic
Nonuniversal transverse electron mean free path through few-layer graphene
In contrast to the in-plane transport electron mean-free path in graphene,
the transverse mean-free path has received little attention and is often
assumed to follow the 'universal' mean-free path (MFP) curve broadly adopted in
surface and interface science. Here we directly measure transverse electron
scattering through graphene from 0 to 25 eV above the vacuum level both in
reflection using Low Energy Electron Microscopy and in transmission using
electron-Volt Transmission Electron Microscopy. From this data, we obtain
quantitative MFPs for both elastic and inelastic scattering. Even at the lowest
energies, the total MFP is just a few graphene layers and the elastic MFP
oscillates with graphene layer number, both refuting the 'universal' curve. A
full theoretical calculation taking the graphene band structure into
consideration agrees well with experiment, while the key experimental results
are reproduced even by a simple optical toy model