130 research outputs found
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Infrared, Raman and cathodoluminescence studies of impact glasses
We studied the infrared reflectance (IR), Raman, and cathodoluminescence (CL) spectroscopic signatures and scanning electron microscope-cathodoluminescence (SEM-CL) images of three different types of impact glasses: Aouelloul impact glass, a Muong Nong-type tektite, and Libyan desert glass. Both backscattered electron (BSE) and CL images of the Muong Nong-type tektite are featureless; the BSE image of the Libyan desert glass shows only weak brightness contrasts. For the Aouelloul glass, both BSE and CL images show distinct brightness contrast, and the CL images for the Libyan desert glass show spectacular flow textures that are not visible in any other microscopic method. Compositional data show that the SiO2 composition is relatively higher and the Al2O3 content is lower in the CL-bright areas than in the CL-dark regions. The different appearance of the three glass types in the CL images indicates different peak temperatures during glass formation: the tektite was subjected to the highest temperature, and the Aouelloul impact glass experienced a relatively low formation temperature, while the Libyan desert glass preserves a flow texture that is only visible in the CL images, indicating a medium temperature.
All IR reflectance spectra show a major band at around 1040 to 1110 cm-1 (antisymmetric stretching of SiO4 tetrahedra), with minor peaks between 745 and 769 cm-1 (Si-O-Si angle deformation). Broad bands at 491 and 821 cm-1 in the Raman spectra in all samples are most likely related to diaplectic glass remnants, indicating early shock amorphization followed by thermal amorphization. The combination of these spectroscopic methods allows us to deduce information about the peak formation temperature of the glass, and the CL images, in particular, show glass flow textures that are not preserved in other more conventional petrographic images
On hydrogen bond correlations at high pressures
In situ high pressure neutron diffraction measured lengths of O H and H O
pairs in hydrogen bonds in substances are shown to follow the correlation
between them established from 0.1 MPa data on different chemical compounds. In
particular, the conclusion by Nelmes et al that their high pressure data on ice
VIII differ from it is not supported. For compounds in which the O H stretching
frequencies red shift under pressure, it is shown that wherever structural data
is available, they follow the stretching frequency versus H O (or O O) distance
correlation. For compounds displaying blue shifts with pressure an analogy
appears to exist with improper hydrogen bonds.Comment: 12 pages,4 figure
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Scanning electron microscopy, cathodoluminescence, and Raman spectroscopy of experimentally shock metamorphosed quartzite
We studied unshocked and experimentally (at 12, 25, and 28 GPa, with 25, 100, 450, and 750°C pre-shock temperatures) shock-metamorphosed Hospital Hill quartzite from South Africa using cathodoluminescence (CL) images and spectroscopy and Raman spectroscopy to document systematic pressure or temperature-related effects that could be used in shock barometry. In general, CL images of all samples show CL-bright luminescent patchy areas and bands in otherwise non-luminescent quartz, as well as CL-dark irregular fractures. Fluid inclusions appear dominant in CL images of the 25 GPa sample shocked at 750°C and of the 28 GPa sample shocked at 450°C. Only the optical image of our 28 GPa sample shocked at 25°C exhibits distinct planar deformation features (PDFs). Cathodoluminescence spectra of unshocked and experimentally shocked samples show broad bands in the near-ultraviolet range and the visible light range at all shock stages, indicating the presence of defect centers on, e.g., SiO4 groups. No systematic change in the appearance of the CL images was obvious, but the CL spectra do show changes between the shock stages. The Raman spectra are characteristic for quartz in the unshocked and 12 GPa samples. In the 25 and 28 GPa samples, broad bands indicate the presence of glassy SiO2, while high-pressure polymorphs are not detected. Apparently,some of the CL and Raman spectral properties can be used in shock barometry
Elastic relaxation behavior, magnetoelastic coupling, and order-disorder processes in multiferroic metal-organic frameworks
OH-defects in multiple-doped orthoenstatite at 4–8 GPa: filling the gap between pure and natural systems
Synthesis and spectroscopic characterisation of aurichalcite (Zn,Cu2+)5(CO3)2(OH)6; implications for Cu–ZnO catalyst precursors
Principles of quantitative absorbance measurements in anisotropic crystals
The accurate measurement of absorbance (A=-log T; T=I/I_0) in anisotropic materials like crystals is highly important for the determination of the concentration and orientation of the oscillator (absorber) under investigation.
The absorbance in isotropic material is linearly dependent on the concentration of the absorber and on the thickness of the sample (A=ɛ·c·t). Measurement of absorbance in anisotropic media is more complicated, but it can be obtained from polarized spectra (i) on three random, but orthogonal sections of a crystal, or (ii) preferably on two orthogonal sections oriented parallel to each of two axes of the indicatrix ellipsoid. To compare among different crystal classes (including cubic symmetry) it is useful to convert measured absorbance values to one common basis (the total absorbance A_tot), wherein all absorbers are corrected as if they were aligned parallel to the E-vector of the incident light. The total absorption coefficient (a_tot=A_tot/t) is calculated by
(i)a_tot = ∑^(3)_(i=1)(a_(max,i)+a_(min,i))/2, or by
(ii) a_tot = a_x + a_y + a_z.
Only in special circumstances will unpolarized measurements of absorbance provide data useful for quantitative studies of anisotropic material. The orientation of the absorber with respect to the axes of the indicatrix ellipsoid is calculated according to A_x/A_tot=cos^2 (x < absorber), and analogously for A_y and A_z. In this way, correct angles are obtained for all cases of symmetry.
The extinction ratio of the polarizer (Pe=I_crossed/I_parallel) has considerable influence on the measured amplitude of absorption bands, especially in cases of strong anisotropic absorbance. However, if Pe is known, the true absorbance values can be calculated even with polarizers of low extinction ratio, according to A max=−log[(T_(max,obs)−0.5·Pe·T_(min,obs))/(1−0.5·Pe)], and similar for A_min.
The theoretical approach is confirmed by measurements on calcite and topaz
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