18 research outputs found

    Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal

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    In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal

    Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal

    Get PDF
    In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal

    Observation of soft X-ray Cherenkov radiation in Al

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    The soft X-ray radiation generated by 5.7 MeV electrons from both an Al foil and a Mylar film in forward direction was experimentally studied. A narrow specific directivity, an ultra-narrow spectral bandwidth and a good consistency between the experiment and theory prove that the Cherenkov radiation (CR) with photon energy near the L-edge of absorption in Al was observed. The results demonstrate that the CR spectral-angular properties and the absolute photon yield can be described well enough using Pafomov's theoretical model and Henke's refractive index database, which is essential for all practical applications
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