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1 research outputs found
Optimized sequential sampling algorithm for EMI near-field scanning
Author
Couckuyt Ivo
Deschrijver Dirk
+5 more
Dhaene Tom
Dorné T
Grenson T
Pissoort D
Vanhee F
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/01/2013
Field of study
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Ghent University Academic Bibliography
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