15 research outputs found

    Profile correction to electron temperature and enhancement factor in soft x-ray pulse-height-analysis measurements in tokamaks

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    Because soft x-ray pulse-height-analysis (PHA) spectra contain chordal information, the electron temperature and the radiation intensity (enhancement factor) measurements do not represent the local values. Assuming that the profile Ansatz for the electron temperature and density is of the form n/sub eo/(1-(ra)/sup 2/)/sup ..cap alpha../ and kT/sub eo/(1--(ra)/sup 2/)/sup ..beta../, we obtain the correction factors for the electron temperature and the enhancement factor as a function of the profile coefficients ..cap alpha.. and ..beta.. and the energy at which the evaluation was made. The corrected values of the temperature are typically between 1 to 10% higher than the values derived from the raw chordal spectra. We also correct the measured radiation intensity for the profile effects. Finally, the spectrum distortion due to pulse pile-up effects is evaluated. A set of curves is given from which the distortion of the spectrum can be obtained, if the electron temperature, the Be or Al filter thickness, and the electronic parameters of the acquisition system are known. 7 refs., 23 figs

    Broadband measurements of electron cyclotron emission in TFTR (Tokamak Fusion Test Reactor) using a quasi-optical light collection system and a polarizing Michelson interferometer

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    For the past three years, a Fourier transform spectrometer diagnostic system, employing a fast-scanning polarizing Michelson interferometer, has been operating on the TFTR tokamak at Princeton Plasma Physics Laboratory. It is used to measure the electron cyclotron emission spectrum over the range 2.5 to 18 cm/sup /minus/1/ (75-540 GHz) with a resolution of 0.123 cm/sup /minus/1/(3.7 GHz), at a rate of 72 spectra per second. The quasi-optical system for collecting the light and transporting it through the interferometer to the detector has been designed using the concepts of both Gaussian and geometrical optics in order to produce a system that is efficient over the entire spectral range. The commerical Michelson interferometer was custom-made for this project and is at the state of the art for this type of specialized instrument. Various pre-installation and post-installation tests of the optical system and the interferometer were performed and are reported here. An error propagation analysis of the absolute calibration process is given. Examples of electron cyclotron emission spectra measured in two polarization directions are given, and electron temperature profiles derived from each of them are compared. 34 refs., 17 figs
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