1 research outputs found
Influence of Environment on the Measurement of Rates of Charge Transport across Ag<sup>TS</sup>/SAM//Ga<sub>2</sub>O<sub>3</sub>/EGaIn Junctions
This
paper investigates the influence of the atmosphere used in
the fabrication of top electrodes from the liquid eutectic of gallium
and indium (EGaIn) (the so-called “EGaIn” electrodes),
and in measurements of current density, <i>J</i>(V) (A/cm<sup>2</sup>), across self-assembled monolayers (SAMs) incorporated into
Ag/SR//Ga<sub>2</sub>O<sub>3</sub>/EGaIn junctions, on values of <i>J</i>(V) obtained using these electrodes. A gas-tight measurement
chamber was used to control the atmosphere in which the electrodes
were formed, and also to control the environment in which the electrodes
were used to measure current densities across SAM-based junctions.
Seven different atmospheresair, oxygen, nitrogen, argon, and
ammonia, as well as air containing vapors of acetic acid or waterwere
surveyed using both “rough” conical-tip electrodes,
and “smooth” hanging-drop electrodes. (The manipulation
of the oxide film during the creation of the conical-tip electrodes
leads to substantial, micrometer-scale roughness on the surface of
the electrode, the extrusion of the drop creates a significantly smoother
surface.) Comparing junctions using both geometries for the electrodes,
across a SAM of <i>n</i>-dodecanethiol, in air, gave log |<i>J</i>|<sub>mean</sub> = −2.4 ± 0.4 for the conical
tip, and log |<i>J</i>|<sub>mean</sub> = −0.6
± 0.3 for the drop electrode (and, thus, Δlog |<i>J</i>| ≈ 1.8); this increase in current density is attributed
to a change in the effective electrical contact area of the junction.
To establish the influence of the resistivity of the Ga<sub>2</sub>O<sub>3</sub> film on values of <i>J</i>(V), junctions
comprising a graphite electrode and a hanging-drop electrode were
compared in an experiment where the electrodes did, and did not, have
a surface oxide film; the presence of the oxide did not influence
measurements of log |<i>J</i>(V)|, and therefore did not
contribute to the electrical resistance of the electrode. However,
the presence of an oxide film did improve the stability of junctions
and increase the yield of working electrodes from ∼70% to ∼100%.
Increasing the relative humidity (RH) in which <i>J</i>(V)
was measured did not influence these values (across methyl (CH<sub>3</sub>)- or carboxyl (CO<sub>2</sub>H)-terminated SAMs) over the
range typically encountered in the laboratory (20%–60% (RH))