CORE
🇺🇦
make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
2 research outputs found
Advanced metrology for the 14 nm node double patterning lithography
Author
Besacier M.
Bouyssou R.
+3 more
Carau D.
Dezauzier C.
Gourgon C.
Publication venue
HAL CCSD
Publication date
01/01/2014
Field of study
No full text
International audienc
Crossref
Hal - Université Grenoble Alpes
HAL-CEA
Piezoresistive effect in p-type 3C-SiC at high temperatures characterized using Joule heating
Author
A Baranov
AA Barlian
+42 more
ACH Rowe
C Dezauzier
C Zhang
CH Wu
CM Zetterling
DG Senesky
F Gao
H Chiriac
H Zhuang
H-P Phan
H-P Phan
H-P Phan
H-P Phan
H-P Phan
J Bi
J Kim
JH Wong
JS Milne
JS Shor
K Yasui
KN Vinod
L Wang
L Wang
M Eickhoff
M Li
M Werner
M Willander
NG Wright
PM Sarro
Q Zhou
R He
R Maboudian
R Shao
RS Okojie
RS Okojie
S Littlejohn
SD Nguyen
T Dinh
T Toriyama
T-V Nguyen
X Lu
ZH Wang
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref