83 research outputs found

    Relating Graph Thickness to Planar Layers and Bend Complexity

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    The thickness of a graph G=(V,E)G=(V,E) with nn vertices is the minimum number of planar subgraphs of GG whose union is GG. A polyline drawing of GG in R2\mathbb{R}^2 is a drawing Ξ“\Gamma of GG, where each vertex is mapped to a point and each edge is mapped to a polygonal chain. Bend and layer complexities are two important aesthetics of such a drawing. The bend complexity of Ξ“\Gamma is the maximum number of bends per edge in Ξ“\Gamma, and the layer complexity of Ξ“\Gamma is the minimum integer rr such that the set of polygonal chains in Ξ“\Gamma can be partitioned into rr disjoint sets, where each set corresponds to a planar polyline drawing. Let GG be a graph of thickness tt. By F\'{a}ry's theorem, if t=1t=1, then GG can be drawn on a single layer with bend complexity 00. A few extensions to higher thickness are known, e.g., if t=2t=2 (resp., t>2t>2), then GG can be drawn on tt layers with bend complexity 2 (resp., 3n+O(1)3n+O(1)). However, allowing a higher number of layers may reduce the bend complexity, e.g., complete graphs require Θ(n)\Theta(n) layers to be drawn using 0 bends per edge. In this paper we present an elegant extension of F\'{a}ry's theorem to draw graphs of thickness t>2t>2. We first prove that thickness-tt graphs can be drawn on tt layers with 2.25n+O(1)2.25n+O(1) bends per edge. We then develop another technique to draw thickness-tt graphs on tt layers with bend complexity, i.e., O(2tβ‹…n1βˆ’(1/Ξ²))O(\sqrt{2}^{t} \cdot n^{1-(1/\beta)}), where Ξ²=2⌈(tβˆ’2)/2βŒ‰\beta = 2^{\lceil (t-2)/2 \rceil }. Previously, the bend complexity was not known to be sublinear for t>2t>2. Finally, we show that graphs with linear arboricity kk can be drawn on kk layers with bend complexity 3(kβˆ’1)n(4kβˆ’2)\frac{3(k-1)n}{(4k-2)}.Comment: A preliminary version appeared at the 43rd International Colloquium on Automata, Languages and Programming (ICALP 2016

    A Note on Plus-Contacts, Rectangular Duals, and Box-Orthogonal Drawings

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    A plus-contact representation of a planar graph GG is called cc-balanced if for every plus shape +v+_v, the number of other plus shapes incident to each arm of +v+_v is at most cΞ”+O(1) c \Delta +O(1), where Ξ”\Delta is the maximum degree of GG. Although small values of cc have been achieved for a few subclasses of planar graphs (e.g., 22- and 33-trees), it is unknown whether cc-balanced representations with c<1c<1 exist for arbitrary planar graphs. In this paper we compute (1/2)(1/2)-balanced plus-contact representations for all planar graphs that admit a rectangular dual. Our result implies that any graph with a rectangular dual has a 1-bend box-orthogonal drawings such that for each vertex vv, the box representing vv is a square of side length deg(v)2+O(1)\frac{deg(v)}{2}+ O(1).Comment: A poster related to this research appeared at the 25th International Symposium on Graph Drawing & Network Visualization (GD 2017

    Simplified Emanation Graphs: A Sparse Plane Spanner with Steiner Points

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    Emanation graphs of grade kk, introduced by Hamedmohseni, Rahmati, and Mondal, are plane spanners made by shooting 2k+12^{k+1} rays from each given point, where the shorter rays stop the longer ones upon collision. The collision points are the Steiner points of the spanner. We introduce a method of simplification for emanation graphs of grade k=2k=2, which makes it a competent spanner for many possible use cases such as network visualization and geometric routing. In particular, the simplification reduces the number of Steiner points by half and also significantly decreases the total number of edges, without increasing the spanning ratio. Exact methods of simplification along with mathematical proofs on properties of the simplified graph is provided. We compare simplified emanation graphs against Shewchuk's constrained Delaunay triangulations on both synthetic and real-life datasets. Our experimental results reveal that the simplified emanation graphs outperform constrained Delaunay triangulations in common quality measures (e.g., edge count, angular resolution, average degree, total edge length) while maintain a comparable spanning ratio and Steiner point count.Comment: A preliminary and shorter version of this paper was accepted in SOFSEM 202
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