676 research outputs found

    Plasma boosted electron beams for driving Free Electron Lasers

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    In this paper, we report results of simulations, in the framework of both EuPRAXIA \cite{Walk2017} and EuPRAXIA@SPARC\_LAB \cite{Ferr2017} projects, aimed at delivering a high brightness electron bunch for driving a Free Electron Laser (FEL) by employing a plasma post acceleration scheme. The boosting plasma wave is driven by a tens of \SI{}{\tera\watt} class laser and doubles the energy of an externally injected beam up to \GeV{1}. The injected bunch is simulated starting from a photoinjector, matched to plasma, boosted and finally matched to an undulator, where its ability to produce FEL radiation is verified to yield O(\num{e11}) photons per shot at \nm{2.7}.Comment: 5 pages, 2 figure

    EuPRAXIA@SPARC_LAB: the high-brightness RF photo-injector layout proposal

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    At EuPRAXIA@SPARC_LAB, the unique combination of an advanced high-brightness RF injector and a plasma-based accelerator will drive a new multi-disciplinary user-facility. The facility, that is currently under study at INFN-LNF Laboratories (Frascati, Italy) in synergy with the EuPRAXIA collaboration, will operate the plasma-based accelerator in the external injection configuration. Since in this configuration the stability and reproducibility of the acceleration process in the plasma stage is strongly influenced by the RF-generated electron beam, the main challenge for the RF injector design is related to generating and handling high quality electron beams. In the last decades of R&D activity, the crucial role of high-brightness RF photo-injectors in the fields of radiation generation and advanced acceleration schemes has been largely established, making them effective candidates to drive plasma-based accelerators as pilots for user facilities. An RF injector consisting in a high-brightness S-band photo-injector followed by an advanced X-band linac has been proposed for the EuPRAXIA@SPARC_LAB project. The electron beam dynamics in the photo-injector has been explored by means of simulations, resulting in high-brightness, ultra-short bunches with up to 3 kA peak current at the entrance of the advanced X-band linac booster. The EuPRAXIA@SPARC_LAB high-brightness photo-injector is described here together with performance optimisation and sensitivity studies aiming to actual check the robustness and reliability of the desired working point.Comment: 5 pages,5 figures, EAAC201

    Strumenti di gestione per la Rassegna Stampa on line INGV

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    The manual illustrates tools and procedures used by INGV Press Office in managing press reviews which are made available from INGV web portal. Press reviews include national, international press as well as online sources of information. Acquisition and archiving procedures used for the current press review, as well as for the historical one, starting from 1980, are described into details. Archiving and publishing procedures based on a customized version of the Web Content Management System Plone are commented step by step

    Optical issues for the diagnostic stations for the ELI-NP compton gamma source

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    A high brightness electron Linac is being built in the Compton Gamma Source at the ELI Nuclear Physics facility in Romania. To achieve the design luminosity, a train of 32 bunches, 16 ns spaced, with a nominal charge of 250 pC will collide with the laser beam in the interaction point. Electron beam spot size is measured with optical transition radiation (OTR) profile monitors. In order to measure the beam properties, the optical radiation detecting system must have the necessary accuracy and resolution. This paper deals with the studies of different optic configurations to achieve the magnification, resolution and accuracy in order to measure very small beam (below 30 μm) or to study the angular distribution of the OTR and therefore the energy of the beam. Several configurations of the optical detection line will be studied both with simulation tools (e.g. Zemax) and experimentally. The paper will deal also with the sensibility of optic system (in terms of depth of field, magnification and resolution) to systematic error
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