PROTON RADIOGRAPHY WITH THE PIXEL DETECTOR TIMEPIX

This article presents the processing of radiographic data acquired using the position-sensitive hybrid semiconductor pixel detector Timepix. Measurements were made on thin samples at the medical ion-synchrotron HIT [1] in Heidelberg (Germany) with a 221 MeV proton beam. The charge is energy by the particles crossing the sample is registered for generation of image contrast. Experimental data from the detector were processed for derivation of the energy loss of each proton using calibration matrices. The interaction point of the protons on the detector were determined with subpixel resolution by model fitting of the individual signals in the pixelated matrix. Three methods were used for calculation of these coordinates: Hough transformation, 2D Gaussian fitting and estimate the 2D mean. Parameters of calculation accuracy and calculation time are compared for each method. The final image was created by method with best parameters

The neutron flux characterization on the microtron MT25

Microtron is a small cyclic electron accelerator. When it is used as a source of neutrons, electrons must be converted to neutrons by means of nuclear reactions. Spectra of neutrons produced by high energy X-ray photons in lead and uranium targets installed on the microtron MT25 were measured by the Bonner sphere spectrometer with passive detectors of thermal neutrons. Neutron yield from uranium target was nearly two times higher than from the lead one

Representative experiments recent carried out on microtron MT25

This article aims to provide readers with some interesting experiments carried out on microtron MT25 in last months.The cyclic electron accelerator- microtron MT25 is simply source of electron, photon and neutron beams with energy range from 6MeV to 25MeV

Recent Achievements in NAA, PAA, XRF, IBA and AMS Applications for Cultural Heritage Investigations at Nuclear Physics Institute, Řež

Five case studies are reported on the use of neutron and photon activation analysis (NAA and PAA, respectively), X-ray fluorescence (XRF) analysis, ion beam analysis (IBA), and accelerator mass spectrometry (AMS) for the elemental characterization or dating of various objects of cultural heritage, such as building materials, pottery, metallic artefacts, ancient decorations, or the remains of historical personalities. The use of the individual techniques or their combination proved a useful, frequently indispensable tool for revealing the provenance of the artefacts, the method and time of their manufacturing, the elucidation of ancient human activities, or the verification of various hypotheses or legends related to the artefacts