Quantum pump driven fermionic Mach-Zehnder interferometer

We have investigated the characteristics of the currents in a pump-driven fermionic Mach-Zehnder interferometer. The system is implemented in a conductor in the quantum Hall regime, with the two interferometer arms enclosing an Aharonov-Bohm flux $\Phi$. Two quantum point contacts with transparency modulated periodically in time drive the current and act as beam-splitters. The current has a flux dependent part $I^{(\Phi)}$ as well as a flux independent part $I^{(0)}$. Both current parts show oscillations as a function of frequency on the two scales determined by the lengths of the interferometer arms. In the non-adiabatic, high frequency regime $I^{(\Phi)}$ oscillates with a constant amplitude while the amplitude of the oscillations of $I^{(0)}$ increases linearly with frequency. The flux independent part $I^{(0)}$ is insensitive to temperature while the flux dependent part $I^{(\Phi)}$ is exponentially suppressed with increasing temperature. We also find that for low amplitude, adiabatic pumping rectification effects are absent for semitransparent beam-splitters. Inelastic dephasing is introduced by coupling one of the interferometer arms to a voltage probe. For a long charge relaxation time of the voltage probe, giving a constant probe potential, $I^{(\Phi)}$ and the part of $I^{(0)}$ flowing in the arm connected to the probe are suppressed with increased coupling to the probe. For a short relaxation time, with the potential of the probe adjusting instantaneously to give zero time dependent current at the probe, only $I^{(\Phi)}$ is suppressed by the coupling to the probe.Comment: 10 pages, 4 figure

Current-voltage correlations in interferometers

We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of former in all examples considered here.Comment: 23 pages, 10 figures, minor changes, additional appendix, added reference