Metal Oxide Nanoparticle Growth on Graphene via Chemical Activation with Atomic Oxygen

Chemically interfacing the inert basal plane of graphene with other materials has limited the development of graphene-based catalysts, composite materials, and devices. Here, we overcome this limitation by chemically activating epitaxial graphene on SiC(0001) using atomic oxygen. Atomic oxygen produces epoxide groups on graphene, which act as reactive nucleation sites for zinc oxide nanoparticle growth using the atomic layer deposition precursor diethyl zinc. In particular, exposure of epoxidized graphene to diethyl zinc abstracts oxygen, creating mobile species that diffuse on the surface to form metal oxide clusters. This mechanism is corroborated with a combination of scanning probe microscopy, Raman spectroscopy, and density functional theory and can likely be generalized to a wide variety of related surface reactions on graphene

Reconnaissance et synthese vocale dans les telecommunications

SIGLECNRS-CDST / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc

Rapid and Large-Area Characterization of Exfoliated Black Phosphorus Using Third-Harmonic Generation Microscopy

Black phosphorus (BP) is a layered semiconductor that recently has been the subject of intense research due to its novel electrical and optical properties, which compare favorably to those of graphene and the transition metal dichalcogenides. In particular, BP has a direct bandgap that is thickness-dependent and highly anisotropic, making BP an interesting material for nanoscale optical and optoelectronic applications. Here, we present a study of the anisotropic third-harmonic generation (THG) in exfoliated BP using a fast scanning multiphoton characterization method. We find that the anisotropic THG arises directly from the crystal structure of BP. We calculate the effective third-order susceptibility of BP to be ∼1.64 × 10^–19 m² V^–2. Further, we demonstrate that multiphoton microscopy can be used for rapid, large-area characterization indexing of the crystallographic orientations of many exfoliated BP flakes from one set of multiphoton images. This method is therefore beneficial for samples of areas ∼1 cm² in future investigations of the properties and growth of BP

Rapid and Large-Area Characterization of Exfoliated Black Phosphorus Using Third-Harmonic Generation Microscopy

Black phosphorus (BP) is a layered semiconductor that recently has been the subject of intense research due to its novel electrical and optical properties, which compare favorably to those of graphene and the transition metal dichalcogenides. In particular, BP has a direct bandgap that is thickness-dependent and highly anisotropic, making BP an interesting material for nanoscale optical and optoelectronic applications. Here, we present a study of the anisotropic third-harmonic generation (THG) in exfoliated BP using a fast scanning multiphoton characterization method. We find that the anisotropic THG arises directly from the crystal structure of BP. We calculate the effective third-order susceptibility of BP to be ∼1.64 × 10^–19 m² V^–2. Further, we demonstrate that multiphoton microscopy can be used for rapid, large-area characterization indexing of the crystallographic orientations of many exfoliated BP flakes from one set of multiphoton images. This method is therefore beneficial for samples of areas ∼1 cm² in future investigations of the properties and growth of BP