29 research outputs found

    Shortest Path Distance in Manhattan Poisson Line Cox Process

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    While the Euclidean distance characteristics of the Poisson line Cox process (PLCP) have been investigated in the literature, the analytical characterization of the path distances is still an open problem. In this paper, we solve this problem for the stationary Manhattan Poisson line Cox process (MPLCP), which is a variant of the PLCP. Specifically, we derive the exact cumulative distribution function (CDF) for the length of the shortest path to the nearest point of the MPLCP in the sense of path distance measured from two reference points: (i) the typical intersection of the Manhattan Poisson line process (MPLP), and (ii) the typical point of the MPLCP. We also discuss the application of these results in infrastructure planning, wireless communication, and transportation networks

    System-Level Performance Analysis in 3D Drone Mobile Networks

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    We present a system-level analysis for drone mobile networks on a finite three-dimensional (3D) space. A performance boundary derived by deterministic random (Brownian) motion model over Nakagami-m fading interfering channels is developed. This method allows us to circumvent the extremely complex reality model and obtain the upper and lower performance bounds of actual drone mobile networks. The validity and advantages of the proposed framework are confirmed via extensive Monte-Carlo (MC) simulations. The results reveal several important trends and design guidelines for the practical deployment of drone mobile networks

    Field effect devices

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    Improved Substrate Current Model For Deep Submicron Cmos Transistors

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    An improved substrate current model, incorporating the drain and gate bias dependent velocity saturation region, was described. The substrate current is used for predicting the lifetime of the devices and circuits, subject to hot carrier stressing. The model was used to simulate the transient substrate current in circuit operating conditions, to predict the device and circuit lifetime
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