589 research outputs found

    Advances in imaging THGEM-based detectors

    Get PDF
    The thick GEM (THGEM) [1] is an "expanded" GEM, economically produced in the PCB industry by simple drilling and etching in G-10 or other insulating materials (fig. 1). Similar to GEM, its operation is based on electron gas avalanche multiplication in sub-mm holes, resulting in very high gain and fast signals. Due to its large hole size, the THGEM is particularly efficient in transporting the electrons into and from the holes, leading to efficient single-electron detection and effective cascaded operation. The THGEM provides true pixilated radiation localization, ns signals, high gain and high rate capability. For a comprehensive summary of the THGEM properties, the reader is referred to [2, 3]. In this article we present a summary of our recent study on THGEM-based imaging, carried out with a 10x10 cm^2 double-THGEM detector.Comment: 3 pages, 3 figures. Presented at the 10th Pisa Meeting on Advanced Detectors; ELBA-Italy; May 21-27 200

    Secluded Connectivity Problems

    Full text link
    Consider a setting where possibly sensitive information sent over a path in a network is visible to every {neighbor} of the path, i.e., every neighbor of some node on the path, thus including the nodes on the path itself. The exposure of a path PP can be measured as the number of nodes adjacent to it, denoted by N[P]N[P]. A path is said to be secluded if its exposure is small. A similar measure can be applied to other connected subgraphs, such as Steiner trees connecting a given set of terminals. Such subgraphs may be relevant due to considerations of privacy, security or revenue maximization. This paper considers problems related to minimum exposure connectivity structures such as paths and Steiner trees. It is shown that on unweighted undirected nn-node graphs, the problem of finding the minimum exposure path connecting a given pair of vertices is strongly inapproximable, i.e., hard to approximate within a factor of O(2log1ϵn)O(2^{\log^{1-\epsilon}n}) for any ϵ>0\epsilon>0 (under an appropriate complexity assumption), but is approximable with ratio Δ+3\sqrt{\Delta}+3, where Δ\Delta is the maximum degree in the graph. One of our main results concerns the class of bounded-degree graphs, which is shown to exhibit the following interesting dichotomy. On the one hand, the minimum exposure path problem is NP-hard on node-weighted or directed bounded-degree graphs (even when the maximum degree is 4). On the other hand, we present a polynomial algorithm (based on a nontrivial dynamic program) for the problem on unweighted undirected bounded-degree graphs. Likewise, the problem is shown to be polynomial also for the class of (weighted or unweighted) bounded-treewidth graphs

    A concise review on THGEM detectors

    Get PDF
    We briefly review the concept and properties of the Thick GEM (THGEM); it is a robust, high-gain gaseous electron multiplier, manufactured economically by standard printed-circuit drilling and etching technology. Its operation and structure resemble that of GEMs but with 5 to 20-fold expanded dimensions. The millimeter-scale hole-size results in good electron transport and in large avalanche-multiplication factors, e.g. reaching 10^7 in double-THGEM cascaded single-photoelectron detectors. The multiplier's material, parameters and shape can be application-tailored; it can operate practically in any counting gas, including noble gases, over a pressure range spanning from 1 mbar to several bars; its operation at cryogenic (LAr) conditions was recently demonstrated. The high gain, sub-millimeter spatial resolution, high counting-rate capability, good timing properties and the possibility of industrial production capability of large-area robust detectors, pave ways towards a broad spectrum of potential applications; some are discussed here in brief.Comment: 8 pages, 11 figures; Invited Review at INSTR08, Novosibirsk, Feb 28-March 5 200

    Formal Reasoning for Analyzing Goal Models that Evolve over Time

    Get PDF

    Reconstructing the Past: The Case of the Spadina Expressway

    Get PDF
    In order to build resilient systems that can be operational for a long time, it is important that analysts are able to model the evolution of the requirements of that system. The Evolving Intentions framework models how stakeholders’ goals change over time. In this work, our aim is to validate applicability and effectiveness of this technique on a substantial case. In the absence of ground truth about future evolutions, we used historical data and rational reconstruction to understand how a project evolved in the past. Seeking a well-documented project with varying stakeholder intentions over a substantial period of time, we selected requirements of the Toronto Spadina Expressway. In this paper, we report on the experience and the results of modeling this project over different time periods, which enabled us to assess the modeling and reasoning capabilities of the approach, its support for asking and answering ‘what if’ questions, and the maturity of the underlying tool support. We also demonstrate a novel process for creating time-based models through the construction and merging of scenarios

    Vertex Fault Tolerant Additive Spanners

    Full text link
    A {\em fault-tolerant} structure for a network is required to continue functioning following the failure of some of the network's edges or vertices. In this paper, we address the problem of designing a {\em fault-tolerant} additive spanner, namely, a subgraph HH of the network GG such that subsequent to the failure of a single vertex, the surviving part of HH still contains an \emph{additive} spanner for (the surviving part of) GG, satisfying dist(s,t,H{v})dist(s,t,G{v})+βdist(s,t,H\setminus \{v\}) \leq dist(s,t,G\setminus \{v\})+\beta for every s,t,vVs,t,v \in V. Recently, the problem of constructing fault-tolerant additive spanners resilient to the failure of up to ff \emph{edges} has been considered by Braunschvig et. al. The problem of handling \emph{vertex} failures was left open therein. In this paper we develop new techniques for constructing additive FT-spanners overcoming the failure of a single vertex in the graph. Our first result is an FT-spanner with additive stretch 22 and O~(n5/3)\widetilde{O}(n^{5/3}) edges. Our second result is an FT-spanner with additive stretch 66 and O~(n3/2)\widetilde{O}(n^{3/2}) edges. The construction algorithm consists of two main components: (a) constructing an FT-clustering graph and (b) applying a modified path-buying procedure suitably adopted to failure prone settings. Finally, we also describe two constructions for {\em fault-tolerant multi-source additive spanners}, aiming to guarantee a bounded additive stretch following a vertex failure, for every pair of vertices in S×VS \times V for a given subset of sources SVS\subseteq V. The additive stretch bounds of our constructions are 4 and 8 (using a different number of edges)

    MHSP in reversed-biased operation mode for ion blocking in gas-avalanche multipliers

    Get PDF
    We present recent results on the operation of gas-avalanche detectors comprising a cascade of gas electron multipliers (GEMs) and Micro-Hole and Strip Plates (MHSPs) multiplier operated in reversed-bias (R-MHSP) mode. The operation mechanism of the R-MHSP is explained and its potential contribution to ion-backflow (IBF) reduction is demonstrated. IBF values of 4E-3 were obtained in cascaded R-MHSP and GEM multipliers at gains of about 1E+4, though at the expense of reduced effective gain in the first R- MHSP multiplier in the cascade.Comment: 23 pages, 8 figure

    Sparse Fault-Tolerant BFS Trees

    Full text link
    This paper addresses the problem of designing a sparse {\em fault-tolerant} BFS tree, or {\em FT-BFS tree} for short, namely, a sparse subgraph TT of the given network GG such that subsequent to the failure of a single edge or vertex, the surviving part TT' of TT still contains a BFS spanning tree for (the surviving part of) GG. Our main results are as follows. We present an algorithm that for every nn-vertex graph GG and source node ss constructs a (single edge failure) FT-BFS tree rooted at ss with O(n \cdot \min\{\Depth(s), \sqrt{n}\}) edges, where \Depth(s) is the depth of the BFS tree rooted at ss. This result is complemented by a matching lower bound, showing that there exist nn-vertex graphs with a source node ss for which any edge (or vertex) FT-BFS tree rooted at ss has Ω(n3/2)\Omega(n^{3/2}) edges. We then consider {\em fault-tolerant multi-source BFS trees}, or {\em FT-MBFS trees} for short, aiming to provide (following a failure) a BFS tree rooted at each source sSs\in S for some subset of sources SVS\subseteq V. Again, tight bounds are provided, showing that there exists a poly-time algorithm that for every nn-vertex graph and source set SVS \subseteq V of size σ\sigma constructs a (single failure) FT-MBFS tree T(S)T^*(S) from each source siSs_i \in S, with O(σn3/2)O(\sqrt{\sigma} \cdot n^{3/2}) edges, and on the other hand there exist nn-vertex graphs with source sets SVS \subseteq V of cardinality σ\sigma, on which any FT-MBFS tree from SS has Ω(σn3/2)\Omega(\sqrt{\sigma}\cdot n^{3/2}) edges. Finally, we propose an O(logn)O(\log n) approximation algorithm for constructing FT-BFS and FT-MBFS structures. The latter is complemented by a hardness result stating that there exists no Ω(logn)\Omega(\log n) approximation algorithm for these problems under standard complexity assumptions
    corecore