Long dephasing time and high temperature ballistic transport in an InGaAs open quantum dot

We report on measurements of the magnetoconductance of an open circular InGaAs quantum dot between 1.3K and 204K. We observe two types of magnetoconductance fluctuations: universal conductance fluctuations (UCFs), and 'focusing' fluctuations related to ballistic trajectories between openings. The electron phase coherence time extracted from UCFs amplitude is larger than in GaAs/AlGaAs quantum dots and follows a similar temperature dependence (between T^-1 and T^-2). Below 150K, the characteristic length associated with 'focusing' fluctuations shows a slightly different temperature dependence from that of the conductivity.Comment: 6 pages, 4 figures, proceedings of ICSNN2002, to appear in Physica

Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction

In recent years there has been growing interest in the electronic properties of 'few layer' graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural differences, even if only a few structural determinations are available. Here we report the results of a structural study of bilayer graphene on the Si-terminated SiC(0001) surface, investigated using synchrotron radiation-based photoelectron diffraction and complemented by angle-resolved photoemission mapping of the electronic valence bands. Photoelectron diffraction angular distributions of the graphene C 1s component have been measured at different kinetic energies and compared with the results of multiple scattering simulations for model structures. The results confirm that bilayer graphene on SiC(0001) has a layer spacing of 3.48 Å and an AB (Bernal) stacking, with a distance between the C buffer layer and the first graphene layer of 3.24 Å. Our work generalises the use of a versatile and precise diffraction method capable to shed light on the structure of low-dimensional materials

Hemt structures and technology on GAAS and inp for power amplification in millimetre wave range

The paper introduces a simple and efficient approach for the modelling of low-frequency dispersive phenomena in FETs. It is based on the definition of a virtual, non-dispersive associated device controlled by equivalent port voltages and it is suitable for modelling based on standard nonlinear dynamic approaches, such as lumped-element equivalent circuits. The proposed approach is justified on the basis of a physically-consistent, charge-controlled description of the device, but the results are general and provide a valuable tool for taking into account dispersive effects in FETs by means of an intuitive circuit solution, in the framework of any existing nonlinear dynamic model of the associated non-dispersive device. The new equivalent-voltage description, identified on the basis of conventional measurements carried out under static and small-signal dynamic operating conditions, allows for the accurate prediction of dispersive effects above the frequency cut-off, but the formulation is still compatible, without for al modification, for the modelling of the device behaviour under signal excitations having spectral components in the dispersive low-frequency range. Preliminary results are presented which conferm the validity of the proposed approach

Fully relaxed low-mismatched InAlAs layer on an InP substrate by using a two step buffer

The strain relaxation in low mismatched InxAl1-xAs layers has been studied by triple axis x-ray diffraction, transmission electron microscopy, and photoluminescence. Using a two step buffer, a fully relaxed top layer has been grown by adapting the composition and thickness of a first "strained layer." The threading dislocation density in the top layer is below 106/cm2 and strain is relaxed at the substrate/first layer interface by misfit dislocations. This scheme is a promising method to limit the thickness of buffer layers and obtain fully relaxed pseudosubstrates