Machine learning for advanced characterisation of silicon solar cells

Improving the efficiency, reliability, and durability of photovoltaic cells and modules is key to accelerating the transition towards a carbon-free society. With tens of millions of solar cells manufactured every day, this thesis aims to leverage the available characterisation data to identify defects in solar cells using powerful machine learning techniques. Firstly, it explores temperature and injection dependent lifetime data to characterise bulk defects in silicon solar cells. Machine learning algorithms were trained to model the recombination statistics’ inverse function and predict the defect parameters. The proposed image representation of lifetime data and access to powerful deep learning techniques surpasses traditional defect parameter extraction techniques and enables the extraction of temperature dependent defect parameters. Secondly, it makes use of end-of-line current-voltage measurements and luminescence images to demonstrate how luminescence imaging can satisfy the needs of end-of-line binning. By introducing a deep learning framework, the cell efficiency is correlated to the luminescence image and shows that a luminescence-based binning does not impact the mismatch losses of the fabricated modules while having a greater capability of detecting defects in solar cells. The framework is shown in multiple transfer learning and fine-tuning applications such as half-cut and shingled cells. The method is then extended for automated efficiency-loss analysis, where a new deep learning framework identifies the defective regions in the luminescence image and their impact on the overall cell efficiency. Finally, it presents a machine learning algorithm to model the relationship between input process parameters and output efficiency to identify the recipe for achieving the highest solar cell efficiency with the help of a genetic algorithm optimiser. The development of machine learning-powered characterisation truly unlocks new insight and brings the photovoltaic industry to the next level, making the most of the available data to accelerate the rate of improvement of solar cell and module efficiency while identifying the potential defects impacting their reliability and durability

Automated analysis of internal quantum efficiency using chain order regression

Spectral analysis of internal quantum efficiency (IQE) measurements of solar cells is a powerful method to identify performance-limiting mechanisms in photovoltaic devices. This analysis is usually performed using complex curve-fitting methods to extract various electrical and optical performance parameters. As these traditional fitting methods are not easy to use and are often sensitive to measurement noise, many users do not utilize the full potential of the IQE measurements to provide the key properties of their solar cells. In this study, we propose a simplified approach to analyze IQE curves of silicon solar cells using machine learning models that are trained to extract valuable information regarding the cell's performance and decoupling the parasitic absorption of the anti-reflection coating. The proposed approach is demonstrated to be a powerful characterization tool for solar cells as machine learning unlocks the full potential of IQE measurements

Solar Cell Cracks and Finger Failure Detection Using Statistical Parameters of Electroluminescence Images and Machine Learning

A wide range of defects, failures, and degradation can develop at different stages in the lifetime of photovoltaic modules. To accurately assess their effect on the module performance, these failures need to be quantified. Electroluminescence (EL) imaging is a powerful diagnostic method, providing high spatial resolution images of solar cells and modules. EL images allow the identification and quantification of different types of failures, including those in high recombination regions, as well as series resistance-related problems. In this study, almost 46,000 EL cell images are extracted from photovoltaic modules with different defects. We present a method that extracts statistical parameters from the histogram of these images and utilizes them as a feature descriptor. Machine learning algorithms are then trained using this descriptor to classify the detected defects into three categories: (i) cracks (Mode B and C), (ii) micro-cracks (Mode A) and finger failures, and (iii) no failures. By comparing the developed methods with the commonly used one, this study demonstrates that the pre-processing of images into a feature vector of statistical parameters provides a higher classification accuracy than would be obtained by raw images alone. The proposed method can autonomously detect cracks and finger failures, enabling outdoor EL inspection using a drone-mounted system for quick assessments of photovoltaic fields.</p