Bayesian inference of nanoparticle-broadened x-ray line profiles

A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO$_{2}$ data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions. The comparison of the Bayesian/MaxEnt results from experimental CeO$_2$ with TEM results is favorableComment: 43 pages, 13 Figures, 5 Table

400-fold reduction in saturation field by interlayering

The buildup of stress with increasing thickness of magnetic thin films is a common phenomenon that often induces undesirable anisotropies that can convert an otherwise magnetically soft film into a magnetically hard one. We found that by interlayering such a magnetic thin film with films that are either not lattice matched or have a different crystal structure, reductions in the saturation field as large as 400-fold can be achieved. Differences in grain size appear to be responsible. © 2009 U.S. Government.link_to_subscribed_fulltex