Contributions of leaf rust resistance and awns to agronomic and grain quality performance in winter wheat

Wheat (Triticum aestivum L.) cultivars grown in the Great Plains usually bear awned spikes for their putative value to grain yield and quality. Awnletted cultivars are generally limited to forage-only systems. We hypothesized that an awnletted type would be more acceptable to grain producers if flag leaf senescence is delayed by protection against leaf rust (caused by Puccinia triticina Erikss.), the principal foliar disease affecting wheat production in the southern Great Plains. In field experiments under moderate levels of leaf rust infection, our objective was to estimate the effects of awns and leaf rust resistance according to the action and interaction of genes controlling these traits. Our analysis focused on agronomic and quality attributes previously shown to be influenced by these genes. Experimental lines were developed from crosses between leaf rust-susceptible (awnletted or awned) near-isolines of 'Century' and two leaf rust-resistant, awned backcrossed-derived lines with Lr41 or Lr42 from Triticum tauschii (Coss.) Schmal. For most attributes, genes controlling awns and rust resistance acted additively but with unequal effects. For the average effects of Lr41 and Lr42, grain yield increased by 63 and 26%, test weight increased by 5 and 3%, and kernel weight increased by 14 and 9%. Averaged across resistant and susceptible types for each gene, awns increased yield by 6.2 and 0%, increased test weight by 1.7% (either Lr gene source), and increased kernel weight by 6 and 4%. Rust resistance was more effective in compensating for the absence of awns than awns were in compensating for the lack of rust resistance. Leaf rust resistance improved milling quality by increasing flour yield and kernel diameter, independent of the presence or absence of awns. The development of awnletted cultivars with acceptable grain yield potential and quality appears achievable, but their utility in a grain-only production system will be limited without leaf rust resistance.Peer reviewedPlant and Soil SciencesEntomology and Plant Patholog

Resistance to Wheat streak mosaic virus identified in synthetic wheat lines

Citation: Shoup Rupp, J. L., Simon, Z. G., Gillett-Walker, B., & Fellers, J. P. (2014). Resistance to Wheat streak mosaic virus identified in synthetic wheat lines. Retrieved from http://krex.ksu.eduWheat streak mosaic virus (WSMV) is an important pathogen in wheat that causes significant yield losses each year. WSMV is typically controlled using cultural practices such as the removal of volunteer wheat. Genetic resistance is limited. Until recently, no varieties have been available with major resistance genes to WSMV. Two resistance genes have been derived from Thinopyrum intermedium through chromosome engineering, while a third gene was transferred from bread wheat through classical breeding. New sources of resistance are needed and synthetic wheat lines provide a means of accessing genetic variability in wheat progenitors. A collection of wheat synthetic lines was screened for WSMV resistance. Four lines, 07-SYN-27, -106, -164, and -383 had significant levels of resistance. Resistance was effective at 18 °C and virus accumulation was similar to the resistant control, WGGRC50 containing Wsm1. At 25 °C, resistance was no longer effective and virus accumulation was similar to the susceptible control, Tomahawk

Single-kernel near-infrared analysis for evaluating wheat samples for Fusarium head blight resistance

This report describes a method to estimate the bulk deoxynivalenol (DON) content of wheat grain samples with the single-kernel DON levels estimated by a single-kernel near-infrared (SKNIR) system combined with single-kernel weights. The described method estimated the bulk DON levels in 90% of 160 grain samples to within 6.7 ppm of DON when compared with the DON content determined with the gas chromatography–mass spectrometry method. The single-kernel DON analysis showed that the DON content among DON-containing kernels (DCKs) varied considerably. The analysis of the distribution of DON levels among all kernels and among the DCKs of grain samples is helpful for the in-depth evaluation of the effect of varieties or fungicides on Fusarium head blight (FHB) reactions. The SKNIR DON analysis and estimation of the single-kernel DON distribution patterns demonstrated in this study may be helpful for wheat breeders to evaluate the FHB resistance of varieties in relation to their resistance to the spread of the disease and resistance to DON accumulation