Current Single Event Effect Test Results for Candidate Spacecraft Electronics

Abstract We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC Converters

Current Single Event Effect Test Results for Candidate Spacecraft Electronics

Abstract We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links