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Current Single Event Effect Test Results for Candidate Spacecraft Electronics
Authors
Amy K Moran
Anthony B Sanders
+10Â more
Bliss Carkhuff
Christina M Seidleck
Donald K Hawkins
Hak S Kim
Jackson
James E Forney
James Kinnison
Kenneth A Label
Paul Marshall
Tull E G Stassinopoulos
Publication date
1 January 1997
Publisher
Abstract
Abstract We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC Converters
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Last time updated on 07/12/2020