7 research outputs found

    The Mechanism of Ni-Assisted GaN Nanowire Growth

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    Despite the numerous reports on the metal-catalyzed growth of GaN nanowires, the mechanism of growth is not well understood. Our study of the nickel-assisted growth of GaN nanowires using metalorganic chemical vapor deposition provides key insights into this process. From a comprehensive study of over 130 nanowires, we observe that as a function of thickness, the length of the nanowires initially increases and then decreases. We attribute this to an interplay between the Gibbs–Thomson effect dominant in very thin nanowires and a diffusion induced growth mode at larger thickness. We also investigate the alloy composition of the Ni–Ga catalyst particle for over 60 nanowires using energy dispersive X-ray spectroscopy, which along with data from electron energy loss spectroscopy and high resolution transmission electron microscopy suggests the composition to be Ni<sub>2</sub>Ga<sub>3</sub>. At the nanowire growth temperature, this alloy cannot be a liquid, even taking into account melting point depression in nanoparticles. We hence conclude that Ni-assisted GaN nanowire growth proceeds via a vapor–solid–solid mechanism instead of the conventional vapor–liquid–solid mechanism

    Synthesis and Characterization of ReS<sub>2</sub> and ReSe<sub>2</sub> Layered Chalcogenide Single Crystals

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    We report the synthesis of high-quality single crystals of ReS<sub>2</sub> and ReSe<sub>2</sub> transition metal dichalcogenides using a modified Bridgman method that avoids the use of a halogen transport agent. Comprehensive structural characterization using X-ray diffraction and electron microscopy confirm a distorted triclinic 1<i>T</i>′ structure for both crystals and reveal a lack of Bernal stacking in ReS<sub>2</sub>. Photoluminescence (PL) measurements on ReS<sub>2</sub> show a layer-independent bandgap of 1.51 eV, with increased PL intensity from thicker flakes, confirming interlayer coupling to be negligible in this material. For ReSe<sub>2</sub>, the bandgap is weakly layer-dependent and decreases from 1.31 eV for thin layers to 1.29 eV in thick flakes. Both chalcogenides show feature-rich Raman spectra whose excitation energy dependence was studied. The lower background doping inherent to our crystal growth process results in high field-effect mobility values of 79 and 0.8 cm<sup>2</sup>/(V s) for ReS<sub>2</sub> and ReSe<sub>2</sub>, respectively, as extracted from FET structures fabricated from exfoliated flakes. Our work shows ReX<sub>2</sub> chalcogenides to be promising 2D materials candidates, especially for optoelectronic devices, without the requirement of having monolayer thin flakes to achieve a direct bandgap
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