7 research outputs found
The Mechanism of Ni-Assisted GaN Nanowire Growth
Despite
the numerous reports on the metal-catalyzed growth of GaN nanowires,
the mechanism of growth is not well understood. Our study of the nickel-assisted
growth of GaN nanowires using metalorganic chemical vapor deposition
provides key insights into this process. From a comprehensive study
of over 130 nanowires, we observe that as a function of thickness,
the length of the nanowires initially increases and then decreases.
We attribute this to an interplay between the Gibbs–Thomson
effect dominant in very thin nanowires and a diffusion induced growth
mode at larger thickness. We also investigate the alloy composition
of the Ni–Ga catalyst particle for over 60 nanowires using
energy dispersive X-ray spectroscopy, which along with data from electron
energy loss spectroscopy and high resolution transmission electron
microscopy suggests the composition to be Ni<sub>2</sub>Ga<sub>3</sub>. At the nanowire growth temperature, this alloy cannot be a liquid,
even taking into account melting point depression in nanoparticles.
We hence conclude that Ni-assisted GaN nanowire growth proceeds via
a vapor–solid–solid mechanism instead of the conventional
vapor–liquid–solid mechanism
Synthesis and Characterization of ReS<sub>2</sub> and ReSe<sub>2</sub> Layered Chalcogenide Single Crystals
We report the synthesis of high-quality
single crystals of ReS<sub>2</sub> and ReSe<sub>2</sub> transition
metal dichalcogenides using
a modified Bridgman method that avoids the use of a halogen transport
agent. Comprehensive structural characterization using X-ray diffraction
and electron microscopy confirm a distorted triclinic 1<i>T</i>′ structure for both crystals and reveal a lack of Bernal
stacking in ReS<sub>2</sub>. Photoluminescence (PL) measurements on
ReS<sub>2</sub> show a layer-independent bandgap of 1.51 eV, with
increased PL intensity from thicker flakes, confirming interlayer
coupling to be negligible in this material. For ReSe<sub>2</sub>,
the bandgap is weakly layer-dependent and decreases from 1.31 eV for
thin layers to 1.29 eV in thick flakes. Both chalcogenides show feature-rich
Raman spectra whose excitation energy dependence was studied. The
lower background doping inherent to our crystal growth process results
in high field-effect mobility values of 79 and 0.8 cm<sup>2</sup>/(V
s) for ReS<sub>2</sub> and ReSe<sub>2</sub>, respectively, as extracted
from FET structures fabricated from exfoliated flakes. Our work shows
ReX<sub>2</sub> chalcogenides to be promising 2D materials candidates,
especially for optoelectronic devices, without the requirement of
having monolayer thin flakes to achieve a direct bandgap