Hot carrier diffusion in graphene

We report an optical study of charge transport in graphene. Diffusion of hot carriers in epitaxial graphene and reduced graphene oxide samples are studied using an ultrafast pump-probe technique with a high spatial resolution. Spatiotemporal dynamics of hot carriers after a point-like excitation are monitored. Carrier diffusion coefficients of 11,000 and 5,500 squared centimeters per second are measured in epitaxial graphene and reduced graphene oxide samples, respectively, with a carrier temperature on the order of 3,600 K. The demonstrated optical techniques can be used for non-contact and non-invasive in-situ detection of transport properties of graphene.Comment: 5 pages, 3 figure

Influence of SiO2 or h-BN substrate on the room-temperature electronic transport in chemically derived single layer graphene

The substrate effect on the electronic transport of graphene with a density of defects of about 0.5% (0.5%G) is studied. Devices composed of monolayer 0.5%G, partially deposited on SiO2 and h-BN were used for transport measurements. We find that the 0.5%G on h-BN exhibits ambipolar transfer behaviours under ambient conditions, in comparison to unipolar p-type characters on SiO2 for the same flake. While intrinsic defects in graphene cause scattering, the use of h-BN as a substrate reduces p-doping