Mathematical Modeling of the Interaction of Non-Uniform Field ACFM with Finite Size Cracks

The non-destructive evaluation (NDE) of metal surfaces can be accomplished using the alternating current field measurement (ACFM) technique [1]. In this technique a thin-skin eddy current is induced in the metal and the magnetic field above the metal surface is monitored for any perturbation caused by surface defects. In the non-uniform ACFM, the incident field may be produced by a coil or a wire loop carrying a high frequency current [2].</p

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

Diffractive imaging, in which image-forming optics are replaced by an inverse computation using scattered intensity data, could, in principle, realize wavelength-scale resolution in a transmission electron microscope. However, to date all implementations of this approach have suffered from various experimental restrictions. Here we demonstrate a form of diffractive imaging that unshackles the image formation process from the constraints of electron optics, improving resolution over that of the lens used by a factor of five and showing for the first time that it is possible to recover the complex exit wave (in modulus and phase) at atomic resolution, over an unlimited field of view, using low-energy (30 keV) electrons. Our method, called electron ptychography, has no fundamental experimental boundaries: further development of this proof-of-principle could revolutionize sub-atomic scale transmission imaging

Coherent methods in the X-ray sciences

X-ray sources are developing rapidly and their coherent output is growing extremely rapidly. The increased coherent flux from modern X-ray sources is being matched with an associated rapid development in experimental methods. This article reviews the literature describing the ideas that utilise the increased brilliance from modern X-ray sources. It explores how ideas in coherent X-ray science are leading to developments in other areas, and vice versa. The article describes measurements of coherence properties and uses this discussion as a base from which to describe partially-coherent diffraction and X-ray phase contrast imaging, with its applications in materials science, engineering and medicine. Coherent diffraction imaging methods are reviewed along with associated experiments in materials science. Proposals for experiments to be performed with the new X-ray free-electron-lasers are briefly discussed. The literature on X-ray photon correlation spectroscopy is described and the features it has in common with other coherent X-ray methods are identified. Many of the ideas used in the coherent X-ray literature have their origins in the optical and electron communities and these connections are explored. A review of the areas in which ideas from coherent X-ray methods are contributing to methods for the neutron, electron and optical communities is presented.Comment: A review articel accepted by Advances in Physics. 158 pages, 29 figures, 3 table

Ptychography

Ptychography is a computational imaging technique. A detector records an extensive data set consisting of many inference patterns obtained as an object is displaced to various positions relative to an illumination field. A computer algorithm of some type is then used to invert these data into an image. It has three key advantages: it does not depend upon a good-quality lens, or indeed on using any lens at all; it can obtain the image wave in phase as well as in intensity; and it can self-calibrate in the sense that errors that arise in the experimental set up can be accounted for and their effects removed. Its transfer function is in theory perfect, with resolution being wavelength limited. Although the main concepts of ptychography were developed many years ago, it has only recently (over the last 10 years) become widely adopted. This chapter surveys visible light, x-ray, electron, and EUV ptychography as applied to microscopic imaging. It describes the principal experimental arrangements used at these various wavelengths. It reviews the most common inversion algorithms that are nowadays employed, giving examples of meta code to implement these. It describes, for those new to the field, how to avoid the most common pitfalls in obtaining good quality reconstructions. It also discusses more advanced techniques such as modal decomposition and strategies to cope with three-dimensional () multiple scattering

Coherent X-Ray Diffraction Imaging of Nanostructures

We present here an overview of Coherent X-ray Diffraction Imaging (CXDI) with its application to nanostructures. This imaging approach has become especially important recently due to advent of X-ray Free-Electron Lasers (XFEL) and its applications to the fast developing technique of serial X-ray crystallography. We start with the basic description of coherent scattering on the finite size crystals. The difference between conventional crystallography applied to large samples and coherent scattering on the finite size samples is outlined. The formalism of coherent scattering from a finite size crystal with a strain field is considered. Partially coherent illumination of a crystalline sample is developed. Recent experimental examples demonstrating applications of CXDI to the study of crystalline structures on the nanoscale, including experiments at FELs, are also presented