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1 research outputs found
Effective Test Pattern Generation using LFSR for Memory Testing
Author
Agarwal D. (Deepak)
Bargoti G. (Gaurav)
Himanshu H. (Himanshu)
Singh D. (Dheeraj)
Publication venue
'Engineering Research Publication ERP'
Publication date
01/03/2014
Field of study
Full text link
Volume 2 Issue 3 (March 2014
Neliti
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