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1 research outputs found
Thermal Resistance Analysis by Induced Transient (TRAIT) Method for Power Electronic Devices Thermal Characterization - Part II: Practice and Experiments
Author
BAGNOLI Paolo Emilio CASAROSA Claudio, CIAMPI Mario
DALLAGO Enrico
Publication venue
IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL:
[email protected]
, INTERNET: http://www.ieee.org, Fax: (732)981-9667
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Archivio Istituzionale della Ricerca - Università degli Studi di Pavia
