Thermal Resistance Analysis by Induced Transient (TRAIT) Method for Power Electronic Devices Thermal Characterization - Part II: Practice and Experiments

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IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: [email protected], INTERNET: http://www.ieee.org, Fax: (732)981-9667

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    Last time updated on 03/09/2019