Hybrid reflections from multiple x-ray scattering in epitaxial oxide films

E.H.S. and D.G.S. acknowledge support by the National Science Foundation (NSF) MRSEC program (DMR-1420620).In numerous symmetric θ-2θ scans of phase-pure epitaxial complex oxide thin films grown on single-crystal substrates, we observe x-ray diffraction peaks that correspond to neither the film nor the substrate crystal structure. These peaks are the result of multiple, sequential diffraction events that occur from both the film and the substrate. The occurrence of so-called "hybrid" reflections, while described in the literature, is not widely reported within the complex oxide thin-film community. We describe a simple method to predict and identify peaks resulting from hybrid reflections and show examples from epitaxial complex oxide films belonging to three distinct structural types.Publisher PDFPeer reviewe

Engineering: Cornell Quarterly, Vol.22, No.3 (Spring 1988): Nanofabrication: Where Smaller is Better

IN THIS ISSUE: Ten Years Old and Going Strong: A Commemoration of a Decade of Research at Cornells National Nanofabrication Facility /2 Edward D. Wolf ... Fabricating Transistors in the Nanometer Domain /8 Richard C. Tiberio and Edward D. Wolf ... Links to the Outside World in Submicron-Sized Silicon Devices /11 James R. Phillips and James W. Mayer ... A New Flat Panel Display: Poly-Si-Based Thin-Film Transistors for Large-Area Electronics /15 Dieter G. Ast ... A Red Semiconductor Laser: An Efficient Microscopic Source of Visible Light /21 J. Richard Shealy ... Speeding Up the Electrons in Semiconductor Transistors /24 Paul J. Tasker and Lester F. Eastman ... How a Fungus Recognizes Surface Topography: A Problem Solved through Microfabrication /30 Harvey C. Hoch and Richard C. Staples ... Vantage /35 ... Faculty Publications /3

Preparation of Schottky diodes for EBIC investigation of grain boundary passivation in Si ribbons /

"JPL contract no. 954852. Report #3.""October 1979."Includes bibliographical references (page 6).Mode of access: Internet