\u3cem\u3eIn Situ\u3c/em\u3e Nanomechanical Testing in Focused Ion Beam and Scanning Electron Microscopes

The recent interest in size-dependent deformation of micro- and nanoscale materials has paralleled both technological miniaturization and advancements in imaging and small-scale mechanical testing methods. Here we describe a quantitative in situ nanomechanical testing approach adapted to a dualbeam focused ion beam and scanning electron microscope. A transducer based on a three-plate capacitor system is used for high-fidelity force and displacement measurements. Specimen manipulation, transfer, and alignment are performed using a manipulator, independently controlled positioners, and the focused ion beam. Gripping of specimens is achieved using electron-beam assisted Pt-organic deposition. Local strain measurements are obtained using digital image correlation of electron images taken during testing. Examples showing results for tensile testing of single-crystalline metallic nanowires and compression of nanoporous Au pillars will be presented in the context of size effects on mechanical behavior and highlight some of the challenges of conducting nanomechanical testing in vacuum environments

Incipient plasticity in metallic thin films

The authors have compared the incipient plastic behaviors of Al and Al–Mg thin films during indentation under load control and displacement control. In Al–Mg, solute pinning limits the ability of dislocations to propagate into the crystal and thus substantially affects the appearance of plastic instabilities as compared to pure Al. Displacement control allows for a more sensitive detection of such instabilities, as it does not require collective dislocation motion to the extent required by load-controlled indentation in order to resolve a yield event. This perception is supported by in situ transmission electron microscopy observations.