19 research outputs found

    Fig 1 -

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    GATE geometry model of the dual-panel PEM with monolithic (a) and pixelated (b) crystals. The upper reflective layer in the crystals in b) was assumed transparent in this drawing for ease of visualization. Tomographic images reconstructed parallel to the (x, y) plane are referred to as in-plane.</p

    Fig 2 -

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    Examples of different combinations of coincidence events undergoing a) single interactions in the crystal leading to correct determination of LORs, b) multiple photon interactions in both crystals producing a mispositioned LOR (dashed line).</p

    Transverse and axial views of the miniDerenzo phantom [25] filled with air.

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    The phantom was placed in the middle of the PEM panels which were separated by 6 cm. All units are in mm.</p

    LM-OS ML-EM reconstructed images of the miniDerenzo phantom considering first hit (FH) and energy weighted positions (EW), with and without a post-reconstruction Gaussian filter (GF).

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    LM-OS ML-EM reconstructed images of the miniDerenzo phantom considering first hit (FH) and energy weighted positions (EW), with and without a post-reconstruction Gaussian filter (GF).</p

    GATE to CASToR data conversion.

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    Conversion process of GATE data for pixelated and monolithic crystals into CASToR’s input data. (PDF)</p

    Fig 8 -

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    Horizontal intensity profiles across hot rod diameters of 2 mm (a) and 1.5 mm (b) from the reconstructed images shown in Fig 7 for the monolithic (red continuous lines) and pixelated (blue dashed lines) crystals. For ease of comparison, the profiles share the same maximum intensity for each rod diameter.</p

    Energy spectra of coincidence events registered in both crystal configurations.

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    Around 80% of the events are detected through multiple Compton scattering ending in photoelectric absorption. The histograms in the bottom row show the break-down of events where at least one of the coincidence photons underwent 1, 2 or 3 Compton scatterings (CS1, CS2, CS3).</p

    Percent contributions of the different coincidence events classified as SI and MI in the monolithic and pixelated crystals.

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    Percent contributions of the different coincidence events classified as SI and MI in the monolithic and pixelated crystals.</p
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