Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence

We describe the characterization of sputtered yttria-zirconia composition spread thin films by x-ray fluorescence (XRF). We also discuss our automated analysis of the XRF data, which was collected in a high throughput experiment at the Cornell High Energy Synchrotron Source. The results indicate that both the composition reproducibility of the library deposition and the composition measurements have a precision of better than 1 atomic percent

Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence

We describe the characterization of sputtered yttria-zirconia composition spread thin films by x-ray fluorescence (XRF). We also discuss our automated analysis of the XRF data, which was collected in a high throughput experiment at the Cornell High Energy Synchrotron Source. The results indicate that both the composition reproducibility of the library deposition and the composition measurements have a precision of better than 1 atomic percent

X-ray standing wave technique: principles and applications

The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge about quite different fields in physics and technology. This volume presents comprehensively the theoretical background, technical requirements, and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik, and D Phil Woodruff, the book provides scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications

Surfaçage manuel ou ultrasonique (définitions et comparaisons)

LILLE2-BU Santé-Recherche (593502101) / SudocPARIS-BIUM (751062103) / SudocLILLE2-UFR Odontologie (593502202) / SudocSudocFranceF

Atomic Imaging of Oxide-Supported Metallic Nanocrystals

The nucleation of noble metal nanoparticles on oxide surfaces can lead to dramatic enhancements in catalytic activity that are related to the atomic-scale formation of the nanoparticles and interfaces. For the case of submonolayer Pt deposited on the 2×1 SrTiO₃(001) surface atomic-force microscopy shows the formation of nanoparticles. We use X-ray standing wave (XSW) atomic imaging to show that these nanoparticles are composed of Pt face-centered-cubic nanocrystals with cube-on-cube epitaxy laterally correlated to the substrate unit cell. The phase sensitivity of the XSW allows for a direct measurement of the interface offset between the two unit cells along the <i>c</i>-axis. Different Pt coverages lead to differences in the observed XSW image of the interfacial structure, which is explained by a proposed model based on the Pt–Pt interaction becoming stronger than the Pt–substrate interaction as the global coverage is increased from 0.2 to 0.6 ML

High energy x-ray diffraction∕x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films

High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition. Even for highly textured films, our diffraction technique provides detection of diffraction from each family of Bragg reflections, which affords direct comparison of the measured profiles with powder patterns of known phases. These techniques are important for high throughput combinatorial studies as they provide structure and composition maps which may be correlated with performance trends within an inorganic library