On the Possibility of Designing an Advanced Sensor with Particle Sizing Using Dynamic Light Scattering Time Series Spectral Entropy and Artificial Neural Network

LBUS‐IRG‐2019‐05 LBUS‐IRG‐2020‐06Dynamic Light Scattering is a well-established technique used in particle sizing. An alternative procedure for Dynamic Light Scattering time series processing based on spectral entropy computation and Artificial Neural Networks is described. An error analysis of the proposed method was carried out and the results on both the simulated and on the experimental DLS time series are presented in detail. The results reveal the possibility of designing an advanced sensor capable of detecting particles with a size bigger than a threshold using this alternative for processing the DLS time series.publishersversionpublishe

Modeling and X-ray Analysis of Defect Nanoclusters Formation in B4C under Ion Irradiation

In the presented work, B4C was irradiated with xenon swift heavy ions at the energy of 167 MeV. The irradiation of the substrate was done at room temperature to a fluence of 3.83 × 1014 ion/cm2. The samples were then analyzed with the X-ray diffraction technique to study the structural modification, as it can probe the region of penetration of xenon atoms due to the low atomic number of the two elements involved in the material under study. The nano-cluster formation under ion irradiation was observed. Positron lifetime (PLT) calculations of the secondary point defects forming nanoclusters and introduced into the B4C substrate by hydrogen and helium implantation were also carried out with the Multigrid instead of the K-spAce (MIKA) simulation package. The X-ray diffraction results confirmed that the sample was B4C and it had a rhombohedral crystal structure. The X-ray diffraction indicated an increase in the lattice parameter due to the Swift heavy ion (SHI) irradiation. In B12-CCC, the difference between τ with the saturation of H or He in the defect is nearly 20 ps. Under the same conditions with B11C-CBC, there is approximately twice the value for the same deviation