Genetics of grain yield and its components in wheat under heat stress

Heat stress is a matter of a great concern for the wheat crop. Heat stress usually either hastens crop development or shortens the grain filling duration, which severely reduces grain yield. Being a complex trait, understanding the genetics and gene interactions of stress tolerance are the two primary requirements for improving yield levels. Genetic analysis through generation mean analysis helps to find out the nature of gene actions involved in a concerned trait by providing an estimate of main gene effects (additive and dominance) along with their digenic interactions (additive × additive, additive × dominance, and dominance × dominance). In the present investigation, we elucidated the inheritance pattern of different yield contributing traits under heat stress using different cross combinations which could be helpful for selecting a suitable breeding strategy. Thus six generations of five crosses were sown normal (non-stress, TS) and late (heat stress, LS) in a randomized block design with three replications during two crop seasons. The model was not adequate for late sown conditions indicating the expression of epistatic genes under stress conditions. The traits i.e. Days to heading (DH), Days to anthesis (DA), Days to maturity (DM), Grain filling duration (GFD), Grain yield (GY), Thousand grain weight (TGW), Grain weight per spike (GWS) and Heat susceptibility index (HSI) under heat stress conditions were found under the control of additive gene action with dominance × dominance interaction, additive gene action with additive × dominance epistatic effect, dominance gene action with additive × additive interaction effect, additive and dominance gene action with dominance × dominance interaction effect, additive gene action with additive × dominance epistatic effect, additive gene action with additive × additive interaction effect and dominance gene action with additive × additive interaction effect, respectively