18 research outputs found

    Pathogenic, cultural, morphological and molecular variability among eight isolates of Alternaria solani, causing early blight of tomato

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    Among the fungal diseases infecting tomato crops, early blight caused by Alternaria solani (Ellis and Martin) Jones and Grout is one of the most catastrophic disease causing accountable losses. Further, all of the tomato cultivars presently under cultivation have succumb more or less to early blight disease. Therefore, the present studies were undertaken for the pathogenic, cultural, morphological and molecular variability among the isolates of A. solani. The results reveal all of the eight isolates of A. solani as pathogenic to tomato (Cv. Pusa Ruby) and showed variability amongst them. The test isolates could grow better on the basic culture medium potato dextrose agar; however, highest mycelial growth was recorded on the isolate AsLt (88.50 mm), followed by AsBd (82.36 mm) and AsHl (78.40 mm), with excellent sporulation. All of the eight test isolates exhibited a wide range of variability in respect of their mycelial and conidial dimensions and septation. RAPD-PCR analysis of the four most virulent A. solani isolates, using 13 OPA primers revealed that the isolates AsBd (Beed) and AsLt (Latur) were closely related with 85% genetic similarity whereas, the isolates AsHl (Hingoli) and AsJl (Jalna) were closely related with 50% genetic similarity, but distinct from that of AsLt and AsBd isolates. Key words: Tomato, Alternaria solani, isolates, pathogenic, molecular variability, virulent, primers

    Temperature dependent properties of spray deposited Cu2CoSnS4 (CCTS) thin films (vol 28, pg 18891, 2017)

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    The original version of this article unfortunately contained an error in Sect. 3.3 Structural analysis Equation (7). The corrected version is published with this erratum (Eq. 7)

    Temperature dependent properties of spray deposited Cu2CoSnS4 (CCTS) thin films

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    A modified spray pyrolysis technique was employed for the deposition of Cu2CoSnS4 (CCTS) thin films. X-ray diffraction study showed that the CCTS thin films exhibit stannite structure with preferred orientation along (112) plane. The phase purity of sprayed CCTS films was confirmed from Raman analysis, as the most intense peak is observed at 320 cm(-1) corresponding to A1 mode. With increase in substrate temperature the grains over the surface of the CCTS films become more distinct. The EDAX spectrum revealed the presence of different constituent elements such as, Cu, Co, Sn and S for the films deposited at 325 A degrees C. The optical absorption study showed that the energy band gap values of the CCTS films are decreasing from 1.70 to 1.46 eV with respect to increase in substrate temperature from 275 to 325 A degrees C
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