Structural Properties of the SnxSy Films Obtained by the Thermal Vacuum Co-evaporation

The present work deals with the study of the structural properties of the SnxSy thin films deposited by the closed-spaced vacuum co-evaporation (CSVCE) method. Calculation of temperature dependencies of the sulfur and tin vapor pressures allows to estimate growth conditions of the films with the stoichiometric composition. The effect of growth conditions on surface morphology and structural properties of SnxSy films were studied. Surface morphology of obtained films was determined by the scanning electron microscope (SEM-102Е). Structural investigations of the films were performed with the X-ray diffraction (XRD) method. The analysis of chemical composition of the layers was carried out by the scanning electron microscope by energy dispersive X-ray (ЕDAX) spectroscopy. Influence of the substrate temperature on chemical composition of thin films and their structural characteristics was also investigated

Determination of fundamental optical constants of Zn2SnO4 films

Examined in this paper have been optical properties of polycrystalline films Zn2SnO4 deposited using the spray pyrolysis method within the range of substrate temperatures 250 °C to 450 °C in increments of 50 °C. The spectral dependences have been found for the following physical quantities: k(), n(), ε1(), ε2() and defined as they change under the influence of substrate temperature Тs. Moreover, using the model by Wemple–DiDomenico it was calculated the dispersion energy Ео and Ed for this oxide. Two independent methods defined band gaps Zn2SnO4, which decreases from 4.21…4.22 eV down to 4.04…4.05 eV with increasing Тs from 250 °C up to 450 °C