78 research outputs found
DIFFUSION LENGTH MEASUREMENTS OF HETEROJUNCTION THIN FILMS BY JUNCTION-EBIC
Junction-EBIC is used to characterize minority carrier diffusion lengths in heterojunction thin films. Because the submicron diffusion lengths of our CuInSe2-(Zn,Cd)S film devices and the diameter of the generation volume are in the same range, EBIC interpretation taking the generation volume as a point source is difficult. In our model we use a finite size of the generation volume to fit the EBIC measurements. It is possible to measure with a higher accelerating voltage and for that reason effects caused by surface recombination and high injection can be avoided. In this paper the model is described and experimental results are presented
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