25 research outputs found
Avalanche-Induced Current Enhancement in Semiconducting Carbon Nanotubes
Semiconducting carbon nanotubes under high electric field stress (~10 V/um)
display a striking, exponential current increase due to avalanche generation of
free electrons and holes. Unlike in other materials, the avalanche process in
such 1D quantum wires involves access to the third sub-band, is insensitive to
temperature, but strongly dependent on diameter ~exp(-1/d^2). Comparison with a
theoretical model yields a novel approach to obtain the inelastic optical
phonon emission length, L_OP,ems ~ 15d nm. The combined results underscore the
importance of multi-band transport in 1D molecular wires
A Comparison Between GaAs Mesfet and Si NMOS ESD Behaviour
Work is in hand at Loughborough University to investigate and compare the ESD sensitivity of GaAs
D-MESFETs and unprotected enhancement mode NMOS structures
Failure mechanisms in MOS devices
Continuous and pulsed voltage stressmg of metal oxide semiconductor (MOS)
transistors and capacitors has been mvestigated. The expenmental work followed a
survey of failure mechanisms in semiconductor devices which Identified Electrical
Overstress Damage (EOS)/Electrostatic Discharge (ESD) damage as the most
frequent cause of failure, accounting for over 50% of all damage observed. The
survey itself, covered all aspects of semiconductor reliability including reliability
modelling and quality assurance.
A qualitative model of oxide breakdown in MOS structures was developed as a
result of the experimental work. Two different mechanisms have been proposed for
continuous and pulsed voltage breakdown. Continuous voltage breakdown simulating EOS conditions, was temperature and
voltage dependent. The long time-scales involved, lead to a model whereby
breakdown IS the result of conduction of charge earners through the oxide, via
electron traps and impunty Sites with energies m the forbidden gap. Pulsed voltage
breakdown simulating ESD, was voltage dependent but not temperature dependent.
The very short time-scales involved indicate that breakdown is the direct result of
electron transport m the oxide conduction band. Electrons are inJected into the
conduction band via quantum-mecharucal tunnelling from the cathode.
Both mechanisms were found to be dependent on the surface charge concentratiOn
of the Silicon and, therefore, polanty dependent. The models explain this effect by
analysing the charge injection process under high electric fields
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Genome editing in plants using the compact editor CasĪ¦
Clustered regularly interspaced short palindromic repeats and CRISPR-associated proteins (CRISPR-Cas) systems have been developed as important tools for plant genome engineering. Here, we demonstrate that the hypercompact CasĪ¦ nuclease is able to generate stably inherited gene edits in Arabidopsis, and that CasĪ¦ guide RNAs can be expressed with either the Pol-III U6 promoter or a Pol-II promoter together with ribozyme mediated RNA processing. Using the Arabidopsis fwa epiallele, we show that CasĪ¦ displays higher editing efficiency when the target locus is not DNA methylated, suggesting that CasĪ¦ is sensitive to chromatin environment. Importantly, two CasĪ¦ protein variants, vCasĪ¦ and nCasĪ¦, both showed much higher editing efficiency relative to the wild-type CasĪ¦ enzyme. Consistently, vCasĪ¦ and nCasĪ¦ yielded offspring plants with inherited edits at much higher rates compared to WTCasĪ¦. Extensive genomic analysis of gene edited plants showed no off-target editing, suggesting that CasĪ¦ is highly specific. The hypercompact size, T-rich minimal protospacer adjacent motif (PAM), and wide range of working temperatures make CasĪ¦ an excellent supplement to existing plant genome editing systems