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    A study on the Relocation of anchorage for Busan New Port

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    Busan New Port is being under construction, and scheduled to be completed by 2015 in order to fulfill the goal of a hub port in Northeast Asia Region in the 21st century. 27 container berth with 9,650,000 TEU handling capacity will be constructed and several more berths for bunker & supply ships and other purpose vessels. Busan New Port has been designed as an alternative port to Busan Port. However, Busan New Port has not enough anchoring space compare to the scale of the port designed, and needs at least 3 more anchorage area for the safety and security. Disaster of Hebei Spirit(Oil tanker accident) which took place at the west coast of Korea in 2007, proofed the importance of proper anchorage area once again. This study attempts to propose an appropriate scale and arrangement for anchorage area of Busan New Port by using marine traffic survey and Ship Handling Simulation techniques. The national harbor master plan(revised) suggests that two(2) vessels of 80,000 GT class anchor at the right front of anchorage area and six(6) vessels of 30,000 GT class at the rest area. According to the survey and simulation, insufficient sea room for maneuvering has been determined at the end of the study. Therefore this study suggests that the incoming container vessel more than 12,000 TEUs capacity should consider to anchor at Yang-Gi-Am (East coast of Geo-Je Island) area and a new anchorage area should be established off The Yeon-do Island for small-and-medium size vessels. And, proper local legislation regarding anchorage area should be prepared in order to reduce the risk of collision and near miss. However the legislation matters are not reviewed at this study and propose it on further studies. Last but not least, it has been recommended that well organized VTS services could prevent the potential risks and accidents in the research area, and further studies for "The maritime and port policy" should be conducted for the sake of well improvement of Busan New Port.์ œ1์žฅ ์„œ๋ก  = 1 1.1 ์—ฐ๊ตฌ์˜ ๋ฐฐ๊ฒฝ ๋ฐ ๋ชฉ์  = 1 1.2 ์—ฐ๊ตฌ์˜ ๋ฒ”์œ„ ๋ฐ ๋ฐฉ๋ฒ• = 2 1.2.1 ์—ฐ๊ตฌ์˜ ๋Œ€์ƒ ๋ฒ”์œ„ = 2 1.2.2 ์—ฐ๊ตฌ์˜ ๋‚ด์šฉ ๋ฐ ๊ตฌ์„ฑ = 3 ์ œ2์žฅ ์ •๋ฐ•์ง€ ๋ถ€๊ทผ ์ž์—ฐํ™˜๊ฒฝ ๋ฐ ํŠน์„ฑ์กฐ์‚ฌ = 5 2.1 ์ž์—ฐํ™˜๊ฒฝ = 5 2.1.1 ๋ฐ”๋žŒ = 6 2.1.2 ํƒœํ’ = 8 2.1.3 ํ•ด๋ฉด๊ธฐ์•• = 12 2.1.4 ๊ธฐ์˜จ = 12 2.1.5 ์•ˆ๊ฐœ = 13 2.1.6 ๊ฐ•์ˆ˜๋Ÿ‰ = 14 2.1.7 ์กฐ์œ„ = 15 2.1.8 ์กฐ๋ฅ˜ = 18 2.1.9 ํŒŒ๋ž‘ = 19 2.2 ์ •๋ฐ•์ง€ ํŠน์„ฑ ์กฐ์‚ฌ = 21 2.2.1 ์ •๋ฐ•์ง€ ํ˜„ํ–‰ ์กฐ์‚ฌ = 21 2.2.2 ํ˜„ ์ •๋ฐ•์ง€ ์„ค์ • ๊ธฐ์ค€ ํ˜„ํ™ฉ = 24 2.2.3 ์ •๋ฐ•์ง€ ๋ถ€๊ทผ ์–ด์žฅ ๋ถ„ํฌ ํ˜„ํ™ฉ = 26 2.3 ์ •๋ฐ•์ง€ ์ด์šฉ ํ˜„ํ™ฉ = 27 2.3.1 ์ •๋ฐ•์ง€ ์ง€์ • ์ดํ›„ ์ด์šฉ ํ˜„ํ™ฉ = 27 2.3.2 ์‹ ํ•ญ ๋ฌผ๋™๋Ÿ‰ ์ฆ๊ฐ€ ํ˜„ํ™ฉ = 27 2.3.3 ์ œ2์ฐจ ์ „๊ตญํ•ญ๋งŒ๊ธฐ๋ณธ๊ณ„ํš ์ˆ˜์ •๊ณ„ํš์— ์˜ํ•œ ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์˜ˆ์ •์ง€ = 30 2.4 ์ •๋ฐ•์ง€ ์ด์šฉ ์„ ๋ฐ• ์‚ฌ๊ณ  ์‚ฌ๋ก€ ํ˜„ํ™ฉ = 32 2.5 ์šฐ๋ฆฌ๋‚˜๋ผ ๋ฐ ์™ธ๊ตญ์˜ ์ •๋ฐ•์ง€ ์ง€์ • ํ˜„ํ™ฉ = 34 ์ œ3์žฅ ํ•ด์ƒ๊ตํ†ต ์กฐ์‚ฌ ๋ถ„์„ = 41 3.1 ํ•ด์ƒ๊ตํ†ต์กฐ์‚ฌ ๋ฐฉ๋ฒ• ๋ฐ ํ˜„ํ™ฉ = 41 3.1.1 ํ•ด์ƒ๊ตํ†ต ์กฐ์‚ฌ์˜ ๊ฐœ์š” = 41 3.1.2 ๋ถ€์‚ฐ์‹ ํ•ญ ์ •๋ฐ•์ง€ ๋ถ€๊ทผํ•ด์—ญ ๊ตํ†ต์กฐ์‚ฌ = 41 3.2 ํ•ด์ƒ๊ตํ†ต ์กฐ์‚ฌ ๋ถ„์„ = 44 3.2.1 ์‹œ๊ฐ„๋Œ€๋ณ„ ํ†ตํ•ญ ๋ถ„์„ = 45 3.2.2 ์กฐ์‚ฌ ์ผ์ž๋ณ„ ํ†ตํ•ญ ๋ถ„์„ = 47 3.2.3 ์„ ๋ฐ•ํฌ๊ธฐ ๊ตฌ๋ถ„๋ณ„ ํ†ตํ•ญ ํ•ญ์ ๋ถ„์„ = 49 3.2.4 ์„ ์ข…๋ณ„ ํ†ตํ•ญ ๋ถ„์„ = 51 3.2.5 ์—ฐ๋„ ๋ถ€๊ทผ ์ •๋ฐ• ์„ ๋ฐ• ๋ถ„์„ = 54 3.3 ํ•ด์ƒ๊ตํ†ต ์กฐ์‚ฌ ๋ถ„์„ ๊ฒฐ๊ณผ = 55 ์ œ4์žฅ ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์˜ˆ๋น„ ๋ฐฐ์น˜์•ˆ = 56 4.1 ์ •๋ฐ•์ง€ ์„ ์ • ์ผ๋ฐ˜ ์กฐ๊ฑด = 56 4.1.1 ๋ฌ˜๋ฐ•์˜ ์ •์˜ ๋ฐ ์ข…๋ฅ˜ = 56 4.1.2 ์ •๋ฐ•์ง€ ์„ ์ • ์ผ๋ฐ˜ ์กฐ๊ฑด = 56 4.1.3 ์ •๋ฐ•์ง€์˜ ๊ทœ๋ชจ ๊ฒฐ์ • ๊ธฐ์ค€ = 57 4.2 ์‹ ํ•ญ ์ •๋ฐ•์ง€์— ๋Œ€ํ•œ ์‹ค์„  ํ˜„์žฅ์กฐ์‚ฌ = 58 4.2.1 ํ˜„์žฌ์˜ ์‹ ํ•ญ ์ •๋ฐ•์ง€์˜ ๊ทœ๋ชจ = 58 4.2.2 ์‹ค์„ ์„ ํ†ตํ•œ ์ €์งˆ ๋ฐ ์ง„์ถœ์ž… ์•ˆ์ „์„ฑ ์กฐ์‚ฌ = 59 4.2.3 ํ˜„ํ–‰ ์‹ ํ•ญ ์ •๋ฐ•์ง€์˜ ์ ์ •์„ฑ ๊ฒ€ํ†  = 63 4.3 ํŒŒ์ฃผ๋ ฅ์„ ๊ณ ๋ คํ•œ ์ •๋ฐ•์ง€ ๋ฐฐ์น˜์•ˆ = 64 4.4 ์ง„์ถœ์ž… ์•ˆ์ „์„ฑ ๋ฐ ์ฃผ๋ณ€ ํ™˜๊ฒฝ์— ๋”ฐ๋ฅธ ์ •๋ฐ•์ง€ ๋ฐฐ์น˜ = 66 4.5 ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์˜ˆ๋น„ ๋ฐฐ์น˜์•ˆ = 68 4.5.1 ์‹ ํ•ญ ์ •๋ฐ•์ง€ ๋Œ€์ƒ ์„ ๋ฐ•๋ณ„ ๋ฐ˜๊ฒฝ ์‚ฐ์ถœ = 70 4.5.2 ์ •๋ฐ•์ง€ ๋ฐฐ์น˜์•ˆ = 70 4.6 ์ด์šฉ์ž ์˜๊ฒฌ์ˆ˜๋ ด = 72 4.6.1 ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์ ์ • ๊ทœ๋ชจ ๊ด€๋ จ ์„ค๋ฌธ์กฐ์‚ฌ = 72 4.6.2 ์„ค๋ฌธ์กฐ์‚ฌ ๊ฒฐ๊ณผ = 72 4.7 ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์ตœ์  ์˜ˆ๋น„ ๋ฐฐ์น˜์•ˆ = 76 ์ œ5์žฅ ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์˜ˆ์ •์•ˆ์— ๋Œ€ํ•œ ์„ ๋ฐ•์กฐ์ข… ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๊ฒ€์ฆ = 77 5.1 ์„ ๋ฐ•์กฐ์ข… ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ํ‰๊ฐ€ ๋ฐฉ๋ฒ• = 77 5.2 ์‹ ํ•ญ ์ •๋ฐ•์ง€ ์˜ˆ์ •์•ˆ์— ๋Œ€ํ•œ ์„ ๋ฐ•์กฐ์ข… ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๊ฒ€์ฆ = 81 5.2.1 ์„ ๋ฐ•์กฐ์ข… ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ์‹œ๋‚˜๋ฆฌ์˜ค = 81 5.2.2 ์„ ๋ฐ•์กฐ์ข… ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๊ฒฐ๊ณผ๋ถ„์„ = 86 5.2.3 ์ข…ํ•ฉํ‰๊ฐ€ = 101 ์ œ6์žฅ ๊ฒฐ๋ก  = 103 6.1 ์—ฐ๊ตฌ์˜ ๊ฒฐ๋ก  = 103 6.2 ์—ฐ๊ตฌ์˜ ํ•œ๊ณ„์  ๋ฐ ํ–ฅํ›„ ์—ฐ๊ตฌ๋ฐฉํ–ฅ = 105 ์ฐธ๊ณ ๋ฌธํ—Œ = 107 ๋ถ€๋ก = 10

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The advantages of transient source analysis over sinusoidal source analysis and the research motivation will follow. At the end of this chapter, the mathematical relationship between transient current and capacitance will be shown to link the time-domain and frequency-domain characteristics organically. In chapter 2, transient current numerical simulation methodology is used to understand the NC characteristics from the point of view of device physics. As a bulk transport model, the basic 1-D drift-diffusion model is adopted. The investigation will be done on how physical parameters such as metal/organic injection barrier (ฯ•), charge carrier mobility (ฮผ), DC applied voltage (VDC), and recombination rate (R) affect transient current and capacitance characteristics. The calculated capacitance characteristics will be analyzed by simple relationships derived in this thesis. Those relationships help to understand NC characteristics in terms of magnitude (ฮ”C), and occurring frequency (fNC). At the end of this chapter, NC occurring frequency (fNC) was derived as a function of device thickness (d), charge carrier mobility (ฮผ), and DC applied voltage (VDC). In chapter 3, experiments were done to analyze NC characteristics in single-layer organic devices and double-layer OLEDs. J-V, EL/PL spectrum, transient current, and capacitance were measured. The physical origin of the NC in both systems is revealed by measurement and simulation.์ž„ํ”ผ๋˜์Šค ๋ถ„๊ด‘๋ฒ•์€ ์œ ๊ธฐ ๋ฐ˜๋„์ฒด ์†Œ์ž์˜ ์ „ํ•˜ ์—ญํ•™์„ ๋ถ„์„ํ•˜๋Š” ๋ฐ ์ž์ฃผ ์‚ฌ์šฉ๋˜๋Š” ๋‹จ์ˆœํ•˜๊ณ  ๋น„ํŒŒ๊ดด์ ์ธ ๋ฐฉ๋ฒ•์ด๋‹ค. ํ•˜์ง€๋งŒ ์ด๋Ÿฌํ•œ ์œ ์šฉ์„ฑ์—๋„ ๋ถˆ๊ตฌํ•˜๊ณ , ๋ฐ์ดํ„ฐ ํ•ด์„์— ์žˆ์–ด ๋ช‡๋ช‡ ์–ด๋ ค์›€์ด ์žˆ๋‹ค. ํŠนํžˆ, ์ €์ฃผํŒŒ์—์„œ ํ˜„์ €ํžˆ ํฌ๊ฒŒ ๋ฐœ์ƒํ•˜๋Š” ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค์— ๋Œ€ํ•ด ์™„์ „ํ•œ ๋ฌผ๋ฆฌ์  ์ดํ•ด๊ฐ€ ์ด๋ฃจ์–ด์ง€์ง€ ์•Š์•˜๋‹ค. ๋”ฐ๋ผ์„œ, ์ด ๋ณธ ํ•™์œ„ ๋…ผ๋ฌธ์—์„œ๋Š” ๊ณผ๋„ ์ „๋ฅ˜ ๋ถ„์„์„ ์‚ฌ์šฉํ•˜์—ฌ ์œ ๊ธฐ ๋ฐ˜๋„์ฒด ์†Œ์ž์˜ NC ํŠน์„ฑ์„ ์†Œ์ž ๋ฌผ๋ฆฌ์™€ ๊ด€๋ จ ์ง€์–ด ์ •์„ฑ, ์ •๋Ÿ‰์ ์œผ๋กœ ์ดํ•ดํ•˜๋Š” ๊ฒƒ์„ ๋ชฉํ‘œ๋กœ ํ•œ๋‹ค. 1์žฅ์—์„œ๋Š” ์ž„ํ”ผ๋˜์Šค ๋ถ„๊ด‘๋ฒ•์— ๋Œ€ํ•œ ์†Œ๊ฐœ๋ฅผ ๋‹ค๋ฃจ์—ˆ๋‹ค. ๊ฐ„๋‹จํ•œ ์ธก์ • ๋ฐฉ๋ฒ•๊ณผ ํ•จ๊ป˜ ์ž„ํ”ผ๋˜์Šค๊ฐ€ ์ž…๋ ฅ ์ „์•• ๋ฐ ์ถœ๋ ฅ ์ „๋ฅ˜์˜ ํ•จ์ˆ˜๋กœ์จ ์–ด๋–ป๊ฒŒ ํ‘œํ˜„๋˜๋Š”์ง€ ๋‚˜ํƒ€๋ƒˆ๋‹ค. ์–ด๋“œ๋ฏธํ„ด์Šค, ์ปจ๋•ํ„ด์Šค ๋ฐ ์ปคํŒจ์‹œํ„ด์Šค ๋“ฑ ์ž„ํ”ผ๋˜์Šค ๋ถ„์„์— ์žˆ์–ด ์ค‘์š”ํ•œ ํŒŒ์ƒ ๋ณ€์ˆ˜๋“ค ์—ญ์‹œ ์ •์˜๋˜์—ˆ๋‹ค. ๋˜ํ•œ ์ž„ํ”ผ๋˜์Šค ๋ถ„์„๋ฒ•์˜ ๋‹ค์–‘ํ•œ ์‘์šฉ ๋ฐฉ๋ฒ•์„ ์‚ฌ๋ก€์™€ ํ•จ๊ป˜ ์„ค๋ช…ํ•˜์˜€๋‹ค. ์ด ์žฅ์˜ ๋์—์„œ๋Š” ๊ณผ๋„ ์ „๋ฅ˜ ๋ถ„์„๋ฒ•์ด ๊ต๋ฅ˜ ์‹ ํ˜ธ ๋ถ„์„ ๋Œ€๋น„ ๊ฐ–๋Š” ์ด์ ๊ณผ ์ž์„ธํ•œ ์—ฐ๊ตฌ ๋™๊ธฐ๊ฐ€ ๋’ค์ด์–ด ์„œ์ˆ ๋˜์—ˆ๋‹ค. ๊ณผ๋„ ์ „๋ฅ˜์™€ ์บํŒจ์‹œํ„ด์Šค ๊ฐ„์˜ ์ˆ˜ํ•™์  ๊ด€๊ณ„๋ฅผ ์„œ์ˆ ํ•˜๊ณ , ์‹œ๊ฐ„ ์˜์—ญ๊ณผ ์ฃผํŒŒ์ˆ˜ ์˜์—ญ ํŠน์„ฑ์ด ์–ด๋–ป๊ฒŒ ์œ ๊ธฐ์ ์œผ๋กœ ์—ฐ๊ฒฐ๋˜๋Š”์ง€ ์„ค๋ช…ํ–ˆ๋‹ค. 2 ์žฅ์—์„œ๋Š” ๊ณผ๋„ ์ „๋ฅ˜ ์ˆ˜์น˜ ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๋ฐฉ๋ฒ•๋ก ์„ ์‚ฌ์šฉํ•˜์—ฌ ์†Œ์ž ๋ฌผ๋ฆฌํ•™์˜ ๊ด€์ ์—์„œ ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค ํŠน์„ฑ์„ ์ดํ•ดํ•˜์˜€๋‹ค. ์œ ๊ธฐ๋ฌผ ์ธต ์ „ํ•˜ ์šด์†ก ๋ชจ๋ธ๋กœ๋Š” ๊ธฐ๋ณธ 1 ์ฐจ์› ํ‘œ๋™-ํ™•์‚ฐ ๋ชจ๋ธ์ด ์ฑ„ํƒ๋˜์—ˆ๋‹ค. ๊ธˆ์† / ์œ ๊ธฐ๋ฌผ ๊ณ„๋ฉด์˜ ์ „ํ•˜ ์ฃผ์ž… ์žฅ๋ฒฝ, ์ „ํ•˜ ์ด๋™๋„, ์ง๋ฅ˜ ์ธ๊ฐ€ ์ „์•• ๋ฐ ์ „์ž-์ •๊ณต ์žฌ๊ฒฐํ•ฉ ์†๋„์™€ ๊ฐ™์€ ๋ฌผ๋ฆฌ์  ๋งค๊ฐœ ๋ณ€์ˆ˜๊ฐ€ ๊ณผ๋„ ์ „๋ฅ˜ ๋ฐ ์ •์ „ ์šฉ๋Ÿ‰ ํŠน์„ฑ์— ์–ด๋–ค ์˜ํ–ฅ์„ ๋ฏธ์น˜๋Š”์ง€ ์กฐ์‚ฌ๋˜์—ˆ๋‹ค. ๊ณ„์‚ฐ๋œ ์บํŒจ์‹œํ„ด์Šค ํŠน์„ฑ์€ ์ด ๋…ผ๋ฌธ์—์„œ ๋„์ถœ๋œ ๊ฐ„๋‹จํ•œ ์–‘์  ๊ด€๊ณ„์‹์œผ๋กœ๋ถ€ํ„ฐ ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค์˜ ํฌ๊ธฐ ๋ณ€ํ™”๋ฅผ ๊ณผ๋„ ์ „๋ฅ˜์˜ ๋ณ€ํ™”๋Ÿ‰, ์ „๋ฅ˜ ๋ณ€ํ™” ์‹œ์ ์˜, ์‹œ๊ฐ„ ๋„๋ฉ”์ธ์˜ ๋ณ€์ˆ˜ ๋ณ€ํ™”์™€ ๊ด€๋ จ ์ง€์„ ์ˆ˜ ์žˆ๋‹ค. ์ด์— ๋”ฐ๋ผ, NC ํŠน์„ฑ ๋ณ€ํ™”์— ๋Œ€ํ•œ ์‰ฌ์šด ํ•ด์„์ด ๊ฐ€๋Šฅํ–ˆ๋‹ค. ๋‚˜์•„๊ฐ€, ์‹œ๋ฎฌ๋ ˆ์ด์…˜์„ ๊ฒฐ๊ณผ๋ฅผ ์ข…ํ•ฉํ•ด NC ๋ฐœ์ƒ ์ฃผํŒŒ์ˆ˜๋ฅผ ์†Œ์ž ์œ ๊ธฐ๋ฌผ ์ธต ๋‘๊ป˜, ์ „ํ•˜ ์ด๋™๋„, ์ง๋ฅ˜ ์ธ๊ฐ€ ์ „์••์˜ ํ•จ์ˆ˜๋กœ์จ ํ‘œํ˜„ํ–ˆ๋‹ค. 3 ์žฅ์—์„œ๋Š” ๋‹จ์ธต ์œ ๊ธฐ ์†Œ์ž ๋ฐ ์ด์ค‘ ์ธต OLED์—์„œ ๋ฐœ์ƒํ•˜๋Š” ๋‚ฎ์€ ์ฃผํŒŒ์ˆ˜ ์˜์—ญ์˜ ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค ํŠน์„ฑ์„ ๋ฉด๋ฐ€ํžˆ ์ดํ•ดํ•˜๊ณ ์ž ์—ฌ๋Ÿฌ๊ฐ€์ง€ ์‹คํ—˜์ด ์ˆ˜ํ–‰๋˜์—ˆ๋‹ค. J-V-L, EL / PL ์ŠคํŽ™ํŠธ๋Ÿผ, ๊ณผ๋„ ์ „๋ฅ˜ ํŠน์„ฑ ๋ฐ ์บํŒจ์‹œํ„ด์Šค ํŠน์„ฑ์ด ์ธก์ •๋˜์—ˆ๋‹ค. ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๊ฒฐ๊ณผ์™€ ์ข…ํ•ฉํ•ด ๋ณผ ๋•Œ, ์šฐ๋ฆฌ๋Š” ๋‘ ์‹œ์Šคํ…œ์—์„œ ๋ชจ๋‘ ๋Š๋ฆฐ ์†Œ์ˆ˜ ์ „ํ•˜์ธ ์ „์ž์˜ ์ฃผ์ž… ๋•Œ๋ฌธ์— ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค๊ฐ€ ๋ฐœ์ƒํ•œ๋‹ค๊ณ  ๊ฒฐ๋ก  ๋‚ด๋ ธ๋‹ค. ์ข…ํ•ฉํ•˜๋ฉด, ๊ณผ๋„ ์ „๋ฅ˜ ๋ชจ์‚ฌ ๋ฐ ์‹คํ—˜ ๋ฐ์ดํ„ฐ ๋ถ„์„์„ ํ†ตํ•ด ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค์˜ ๊ฐœ๋… ๋ฐ ๋ฌผ๋ฆฌ์  ์œ ๋ฐœ ์š”์ธ์— ๋Œ€ํ•ด ์ง๊ด€์ ์ธ ์ ‘๊ทผ์ด ๊ฐ€๋Šฅํ–ˆ๋‹ค. ํŠนํžˆ ๋ณธ ์—ฐ๊ตฌ์—์„œ ์ƒˆ๋กญ๊ฒŒ ์œ ๋„๋œ ์ˆ˜์‹์„ ํ™œ์šฉํ•ด ์Œ์˜ ์ฐจ๋™ ์บํŒจ์‹œํ„ด์Šค์˜ ํฌ๊ธฐ์™€ ๋ฐœ์ƒ ์ฃผํŒŒ์ˆ˜์— ๋Œ€ํ•œ ์ •๋Ÿ‰ ๋ถ„์„์ด ์ด๋ฃจ์–ด์กŒ๋‹ค. ํ–ฅํ›„ ์†Œ์ž NC ํŠน์„ฑ์„ ๋น„๋กฏํ•œ ์ž„ํ”ผ๋˜์Šค ๋ถ„์„์— ์žˆ์–ด, ๋ณธ ์—ฐ๊ตฌ์—์„œ ์ œ์‹œํ•œ ๋ถ„์„ ์‚ฌ๋ก€๋“ค๊ณผ ์ •๋Ÿ‰ ์ˆ˜์‹, ๊ด€๊ณ„๋„ ๋“ฑ์ด ์ฐธ๊ณ  ์ž๋ฃŒ๋กœ ํ™œ์šฉ๋  ์ˆ˜ ์žˆ์„ ๊ฒƒ์ด๋‹ค.Chapter 1. Introduction 1 1.1 Brief introduction to Impedance Spectroscopy 1 1.2 Application of Impedance Spectroscopy to organic semiconductors 7 1.3 Negative differential Capacitance (NC) in organic semiconductor devices 16 1.4 Time - domain analysis of capacitance characteristics 20 Chapter 2. Understanding NC characteristics by transient current simulation 24 2.1 Introduction 24 2.2 Governing equations of transient current numerical simulation 25 2.3 Simulation results and discussion 31 2.4 Conclusion 46 Chapter 3. Analysis of NC characteristics in single- and double-layer organic semiconductor devices 47 3.1 Introduction 47 3.2 Experiments 48 3.3 Simulation results and discussion 58 3.4 Conclusion 63 Chapter 4. Summary and Conclusion 65 Bibliography 68 ์ดˆ ๋ก 71 ๊ฐ์‚ฌ์˜ ๊ธ€ 74Maste
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