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    ๋‚˜๋…ธ์••์ž…์‹œํ—˜์„ ์ด์šฉํ•œ์—ฐ์งˆ ๋ฐ•๋ง‰์—์„œ์˜ ์ ์ฐฉ๋ ฅ ํ‰๊ฐ€

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์žฌ๋ฃŒ๊ณตํ•™๋ถ€, 2017. 2. ๊ถŒ๋™์ผ.๊ณ„๋ฉด์€ ์ด์ข…์†Œ์žฌ๊ฐ„์˜ ์ ‘ํ•ฉ ๋“ฑ์œผ๋กœ ๋‚˜ํƒ€๋‚˜๋ฉฐ, ๋ฐ•๋ง‰๊ณผ ๋ชจ์žฌ์— ๋น„ํ•ด ์ƒ๋Œ€์ ์œผ๋กœ ๊ธฐ๊ณ„์  ํŠน์„ฑ์ด ์ทจ์•ฝํ•œ ๋ถ€๋ถ„์ด๋‹ค. ๊ทธ ์ค‘ ์ฆ์ฐฉ์œผ๋กœ ์ธํ•ด ๋ฐœ์ƒํ•˜๋Š” ๋ฐ•๋ง‰์˜ ์ ์ฐฉ๋ ฅ์€ ๋ฐ•๋ง‰์‹œ์Šคํ…œ์˜ ์‹ ๋ขฐ์„ฑ์„ ํ‰๊ฐ€ํ•˜๊ธฐ ์œ„ํ•œ ์ฃผ์š” ์š”์†Œ ์ค‘ ํ•˜๋‚˜์ด๋‹ค. ๊ทธ ๋™์•ˆ ๋ฐ•๋ง‰์˜ ์ ์ฐฉ๋ ฅ์„ ํ‰๊ฐ€ํ•˜๊ณ ์ž ํ•œ ์‹œํ—˜๋ฒ•๋“ค์€ ๋Œ€๊ฐœ ํŒŒ๊ดด์ ์ธ ๋ฐฉ์‹์„ ์ด์šฉํ•˜์˜€๋‹ค. ๊ทธ๋ž˜์„œ ๋น„ํŒŒ๊ดด์ ์ธ ์‹œํ—˜๋ฒ•์ธ ์••์ž…์‹œํ—˜์œผ๋กœ ์ ์ฐฉ๋ ฅ์„ ํ‰๊ฐ€ํ•˜๋Š” ๊ธฐ์กด ๋ชจ๋ธ์„ ์†Œ๊ฐœํ•˜๊ณ  ์ด๋ฅผ ๊ธฐ์ดˆ๋กœ ๋” ๋ฐœ์ „์‹œํ‚ฌ ๋ฐฉ๋ฒ•์„ ์—ฐ๊ตฌํ•˜์˜€๋‹ค. ๊ธฐ์กด ๋ชจ๋ธ์—์„œ๋Š” ๊ณ„๋ฉด์˜ ์ ์ฐฉ๋ ฅ์œผ๋กœ ์ธํ•ด ์ƒ๋Œ€์ ์œผ๋กœ ์—ฐ์งˆ์˜ ์žฌ๋ฃŒ์˜ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ์ด ๊ตฌ์†๋œ๋‹ค๊ณ  ๋ณด์•˜๋‹ค. ๊ทธ๋ž˜์„œ ๋ฐ•๋ง‰๊ณผ ๊ธฐํŒ์˜ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ์„ ๊ฐ๊ธฐ ๊ตฌํ•˜๊ณ , ๋ฐ•๋ง‰, ๊ธฐํŒ, ๋ณตํ•ฉ๋ฌผ์˜ ๊ฒฝ๋„๋กœ ๊ณ„๋ฉด์ธ์ž๋ฅผ ๊ตฌํ•˜์˜€๋‹ค. ์ดํ›„ ๊ณ„๋ฉด์ธ์ž์™€ ์ƒ๋Œ€์  ์—ฐ์งˆ ์žฌ๋ฃŒ์˜ ๊ฒฝ๋„์™€์˜ ๊ด€๊ณ„๋กœ ์ ์ฐฉ๋ ฅ์„ ๊ตฌํ•  ์ˆ˜ ์žˆ๋‹ค. ์ด๋ ‡๊ฒŒ ํ•˜์—ฌ ๊ธฐ์กด ๋ชจ๋ธ์—์„œ๋Š” ๊ฐ™์€ ์žฌ๋ฃŒ๋กœ ๊ณต์ • ๊ณผ์ •์„ ๋‹ค๋ฅด๊ฒŒ ํ•˜์—ฌ ๊ทธ ์ ์ฐฉ๋ ฅ์„ ๋น„๊ตํ•  ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ทธ๋Ÿฌ๋‚˜ ๊ธฐํŒ์˜ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ์„ ๊ตฌํ•  ๋•Œ ๋ฐ•๋ง‰๊ณผ์˜ ๊ด€๊ณ„๋ฅผ ๊ณ ๋ คํ•˜์ง€ ์•Š์•˜๊ธฐ ๋•Œ๋ฌธ์— ๋‹ค๋ฅธ ์žฌ๋ฃŒ๋ผ๋ฆฌ ์ ์ฐฉ๋ ฅ์„ ๋น„๊ตํ•  ๋•Œ์—๋Š” ๊ธฐ์กด ๋ชจ๋ธ์„ ์‚ฌ์šฉํ•  ์ˆ˜ ์—†๋‹ค. ๊ทธ๋ ‡๊ธฐ ๋•Œ๋ฌธ์— ์‹ค์ œ ๋ณตํ•ฉ๋ฌผ์˜ ์••์ž…๊ณผ์ •์—์„œ ๋ฐ•๋ง‰ ๋‚ด๋ถ€์— ์ˆ˜์•• ๋ถ€๋ถ„์ด ์ƒ๊ธด๋‹ค๋Š” ์—ฐ๊ตฌ๋ฅผ ๋ฐ”ํƒ•์œผ๋กœ ํ•˜์—ฌ, ๊ฐ„์ ‘์ ์œผ๋กœ ๊ธฐํŒ์˜ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ์„ ๊ตฌํ•  ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ฒฝ์งˆ์˜ ๊ธฐํŒ ์œ„์— ์„œ๋กœ ๋‹ค๋ฅธ ์—ฐ์งˆ ๋ฐ•๋ง‰, ์„œ๋กœ ๋‹ค๋ฅธ ๊ฒฝ์งˆ ๊ธฐํŒ ์œ„์— ์—ฐ์งˆ ๋ฐ•๋ง‰์„ ์ œ์ž‘ํ•˜์—ฌ ์Šคํฌ๋ž˜์น˜ ํ…Œ์ŠคํŠธ์™€ ๋น„๊ตํ•˜์˜€๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ์„œ๋กœ ๋‹ค๋ฅธ ๊ฒฝ์งˆ ๊ธฐํŒ ์œ„์— ์—ฐ์งˆ ๋ฐ•๋ง‰์˜ ์ ์ฐฉ๋ ฅ์„ ์ •์„ฑ์ ์œผ๋กœ ๋น„๊ตํ•˜๋Š” ๊ฒƒ์— ์ƒˆ๋กœ ์ œ์‹œํ•œ ๋ชจ๋ธ์„ ์“ฐ๋Š” ๊ฒƒ์ด ์ ํ•ฉํ•จ์„ ํ™•์ธํ•  ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ฐ™์€ ์žฌ๋ฃŒ, ๋‹ค๋ฅธ ๊ณต์ •์„ ์ด์šฉํ•  ๋•Œ์—๋งŒ ๊ธฐ์กด ๋ชจ๋ธ๋กœ ๋น„๊ตํ•  ์ˆ˜ ์žˆ์—ˆ๋‹ค๋Š” ํ•œ๊ณ„์—์„œ ๋ฒ—์–ด๋‚˜, ์—ฐ์งˆ์˜ ๋ฐ•๋ง‰์„ ์ฆ์ฐฉํ•œ๋‹ค๋ฉด ์„œ๋กœ ๋‹ค๋ฅธ ์žฌ๋ฃŒ์—์„œ๋„ ์ ์ฐฉ๋ ฅ ๋น„๊ต๊ฐ€ ๊ฐ€๋Šฅํ•˜๊ฒŒ ๋˜์—ˆ๋‹ค๋Š” ์ ์—์„œ ๋ชจ๋ธ์˜ ์˜์˜๋ฅผ ๊ฐ–๋Š”๋‹ค.1. ์„œ๋ก  1 2. ์ด๋ก ์  ๋ฐฐ๊ฒฝ 3 2.1. ์ ์ฐฉ๋ ฅ ์ธก์ • ๋ฐฉ๋ฒ•๋“ค 3 2.2.๋‚˜๋…ธ์••์ž…์‹œํ—˜๋ฒ• 5 3. ๋‚˜๋…ธ์••์ž…์‹œํ—˜์„ ์ด์šฉํ•œ ๋ฐ•๋ง‰์˜ ์ ์ฐฉ๋ ฅ ํ‰๊ฐ€ 11 3.1. ๋ชจ๋ธ์˜ ๊ธฐ๋ณธ ๊ฐœ๋… 11 3.2. ๊ณ„๋ฉด์ธ์ž์™€ ์ ์ฐฉ๋ ฅ 14 3.3. ๊ธฐ์กด ๋ชจ๋ธ์˜ ์‹คํ—˜ ๋ฐฉ๋ฒ• ๋ฐ ์˜์˜์™€ ํ•œ๊ณ„ 16 4. ์—ฐ์งˆ ๋ฐ•๋ง‰ ๋ณตํ•ฉ๋ฌผ์—์„œ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ ๋ชจ๋ธ 21 4.1. ๋ณตํ•ฉ๋ฌผ์—์„œ์˜ ๊ธฐํŒ์ด ๋ฐ›๋Š” ํž˜๊ณผ ์†Œ์„ฑ๋ณ€ํ˜•์—ญ 21 4.2. ๋ชจ๋ธ๋ง ๊ตฌ์ฒดํ™” 24 5. ์‹œํŽธ ์ œ์ž‘ ๋ฐ ๋ถ„์„ 29 5.1. ์‹œํŽธ ์ œ์ž‘ ๊ณผ์ • ๋ฐ ์‹คํ—˜ ๋ฐฉ๋ฒ• 29 5.2. ์Šคํฌ๋ž˜์น˜ ํ…Œ์ŠคํŠธ 31 5.3. ์‹คํ—˜ ๊ฒฐ๊ณผ ๋ฐ ๋ถ„์„ 32 6. ๊ฒฐ๋ก  45 ์ฐธ๊ณ ๋ฌธํ—Œ 46 Appendix 48 Abstract 53Maste

    Channel-Stacked NAND Flash Memory with High-ฮบ Charge Trapping Layer for High Scalability

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    ํ•™์œ„๋…ผ๋ฌธ (๋ฐ•์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์ „๊ธฐยท์ปดํ“จํ„ฐ๊ณตํ•™๋ถ€, 2016. 2. ๋ฐ•๋ณ‘๊ตญ.Exploding demands for mobile devices induce the drastic expansion of the market of NAND flash memory as high density storage devices. Three-dimensional (3D) NAND flash memory paved a new way of increasing the memory capacity by stacking cells in three-dimension. For stacked NAND flash memory, the thickness of ONO (memory dielectric layers) is a roadblock in scaling-down of the minimum feature size, because channel diameter can be scaled down to < 20 nm. However, it is challenging to reduce the thickness of oxide-nitride-oxide (ONO) layer, since the charge trapping properties degrade when the Si3N4 is made thinner. .In this thesis, the channel stacked NAND flash memory array (CSTAR) with high-ฮบ charge trapping layer for high scalability is proposed. To adopt high-ฮบ layer into 3D NAND, its memory characteristics were evaluated with capacitors and gate-all-around flash memory devices. Finally, 4-layer channel stacked memory with high-ฮบ layer was successfully fabricated and characterized. Recent trend of nonvolatile memories are introduced and the overview of 3D stacked NAND flash memory technology is presented in Chapter 1 and 2. In Chapter 3, the memory characteristics of high-ฮบ layer were evaluated with fabricated capacitors and flash memory devices. In Chapter 4, fabrication process and electrical characteristics of CSTAR with high-ฮบ are shown. With the comparison with previous works using ONO layer, CSTAR with high-ฮบ is evaluated. In Chapter 5, the novel operation method of CSTAR is presented. Using TCAD and measurement, a newly designed operation method is verifiedChapter 1 Introduction 1 1.1 Flash Memory Technology 1 1.2 Flash Memory Unit Cell and Array Structure 6 1.3 NAND Cell Operation 13 1.4 Charge Trap Flash Memory 25 Chapter 2 3-D Stacked NAND Flash Memory 28 2.2 Examination of Previous 3-D Stacked NAND Flash 28 2.2.1 Gate Stack Type 3-D NAND Flash Memory 28 2.2.2 Channel Stack Type 3-D NAND Flash Memory 36 2.2.3 Comparison between the Gate Stack Type and the Channel Stack Type 45 Chapter 3 Channel Stacked NAND Flash Memory with high- Charge Trapping Layer 48 3.1 Introduction 48 3.2 Memory Characteristics of HfO2 52 3.3 Fabrication of Nanowire Memory Devices with high-ฮบ Dielectric Layer 56 Chapter 4 Fabrication of Channel Stacked NAND Flash Memory with High-ฮบ 66 4.1 Introduction 66 4.2 Fabrication Method 67 4.3 Key Process Steps of CSTAR with high-ฮบ 72 4.3.1 Single Crystalline Silicon Channel 72 4.3.2 Fin Patterning 74 4.3.3 Stacked Nanowires 76 4.4 Measurement Results 81 4.5 Comparison with Previous Works 88 Chapter 5 Novel Program Operation in CSTAR 92 5.1 Introduction. 92 5.2 Simulation Results 93 5.3 Measurement Results 103 Chapter 6 Conclusions 106 Bibliography 108 Abstract in Korean 116 List of Publications 118Docto

    ์•„๋ฐ€๋กœ์ˆ˜ํฌ๋ ˆ์ด์Šค์™€ ๋ฉ”๋šœ๊ธฐ์ฝฉ ๊ฒ€์„ ์ด์šฉํ•œ ์ง€์†Œํ™”์„ฑ ์ „๋ถ„์˜ ์ œ์กฐ ๋ฐ ๋ฌผ๋ฆฌํ™”ํ•™์  ํŠน์„ฑ

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ๋†์ƒ๋ช…๊ณตํ•™๋ถ€, 2011.2. ๋ฌธํƒœํ™”.Maste

    ํ•œ ๋†์ดŒ์ง€์—ญ ์ธ๊ตฌ ์ง‘๋‹จ์—์„œ ๋ฏธ์„ธ์•Œ๋ถ€๋ฏผ๋‡จ์— ๋…๋ฆฝ์ ์œผ๋กœ ์˜ํ–ฅ์„ ๋ฏธ์น˜๋Š” BaPWV ์ƒ์Šน์— ๊ด€ํ•œ ์—ฐ๊ตฌ

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋ณด๊ฑด๋Œ€ํ•™์› : ๋ณด๊ฑดํ•™๊ณผ ๋ณด๊ฑดํ•™ ์ „๊ณต, 2016. 2. ์กฐ์„ฑ์ผ.Objectives Microalbuminuria is used to a predictor for cardiovascular morbidity and mortality due to cardiovascular diseases. Also, microalbuminuria is a marker of generalized endothelial dysfunction resulting from arterial stiffness or insulin resistance. However, the mechanism of microalbuminuria is unclear. Therefore, it is important to evaluate the relationship between arterial stiffness or insulin resistance and microalbuminuria. Meanwhile, brachial-ankle pulse wave velocity (baPWV) is a good measure of arterial stiffness. Thus, baPWV is a useful measure for explain the relationship between arterial stiffness and microalbuminuria. This study aimed to investigate whether elevated baPWV is independently associated with microalbuminuria. Methods This study included 1,648 individuals aged over 40 who participated in baseline Multi-Rural Cohort Study conducted in Korean rural communities between 2005 and 2006. The participants were classified into: less than 30mg/g as normoalbuminuria or 30-300mg/g as microalbuminuria using urinary albumin creatinine ratio (UACR). BaPWV data were transformed to a normal distribution using natural logarithms to improve normality. Multivariate logistic regression analyses were performed to determine associations with baPWV and microalbuminuria and odds ratios were calculated. Results The median and Q1-Q3 baPWV values were significantly higher in the microalbuminuric group both in men (1538, 1370-1777 cm/s vs. 1776, 1552-2027 cm/s, p<0.001) and in women (1461, 1271-1687cm/s vs. 1645, 1473-1915cm/s, p<0.001). Five models were used to estimate the relation between baPWV and microalbuminuria. The baPWV was independently associated with microalbuminuria in both genders after adjusting for heart rate, fasting blood glucose, triglyceride, homeostatic model assessment insulin resistance and history of hypertension and diabetes. Fasting blood sugar and HOMAIR were judged they had nothing to do with multicolinearity (r=0.532, p<0.001). Log(baPWV) (OR15.813, 95%CI2.629-95.119) was the only independent risk factor in men, while log(baPWV) (OR5.399, 95%CI1.157-25.205) and fasting blood glucose (OR1.011, 95%CI1.002-1.020) were significant in women by adjusting for all significant variables in the univariate analyses. Conclusion BaPWV was the only factor examined that was independently associated with microalbuminuria in both genders and in all the models examined. Elevated baPWV is independently associated with microalbuminuria regardless of insulin resistance among rural subjects over 40 yr. However, baPWV cant be a very good indicator considering relatively low explanatory power representing for adjusted R2 value. It means that many factors contribute to microalbuminuria except baPWV as well as other factors used this study. However, in consideration of not only the ease of the measurement of baPWV but results of this study, it may be a useful screening tool for predicting cardiovascular complications.Introduction 1 Background 1 Literature Review and Necessity of this study 2 Objectives 4 Materials and Methods 5 Subjects and General characteristics variables 5 Study Modeling 8 Brachial-ankle pulse wave velocity 11 Microalbuminuria 13 Blood pressure and blood chemistry 13 Statistical analysis 16 Results 17 General characteristics of the study population 17 Age-adjusted characteristics according to baPWV quartiles 20 UACR levels and distribution of microalbuminuria of study population according to baPWV quartiles 25 Comparison of the normoalbuminuric and microalbuminuric group 29 Odds ratios and 95% Confidence intervals of microalbuminuria stratified by diseases status 34 The relation between baPWV and microalbuminuria 37 Discussion 42 Discussion on Results 42 Limitations and Strengths 46 Conclusion 47 References 49 ๊ตญ๋ฌธ์ดˆ๋ก 55Maste

    Channel Stacked Array NAND Flash Memory With Vertically Stacked String Selection Line (SSL)

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์ „๊ธฐยท์ปดํ“จํ„ฐ๊ณตํ•™๋ถ€, 2012. 8. ๋ฐ•๋ณ‘๊ตญ.Three-dimensional (3D) stacked memory devices are representative solutions that can lead to reduce bit cost of NAND flash memories. Recently, many groups have proposed various types of 3D stacked NAND flash memory devices. In this thesis, we propose a novel 3-D STacked Array (STAR) NAND flash memory featuring Gate-All-Around (GAA) structure with single crystalline Si channel. In Chapter 1 and 2, we introduce a newly designed structure, compact STAR, and address the advantages of compact STAR over other types of 3D stacked NAND flash memories. By using TCAD simulation, we demonstrate that the proposed array structure can support fully compatible device operation with conventional NAND array. In Chapter 3 and 4, we investigate the advantages of metal gates in a 3D stacked NAND flash memory compared with poly-Si gates in terms of the variation of dopant concentration. Also, we show the fact that NAND flash memory cells featuring a GAA structure are less sensitive to the variation of the gate dimensions than cells featuring a DG structure. In Chapter 5, we investigate the cell characteristics with respect to physical dimensions of channel and gate experimentally. Poly-Si channel with GAA structure flash memory cells are successfully fabricated.Abstract i Contents iii 1. Introduction 1 2. Compact Channel Stacked Array 5 2. 1 Concept 5 2. 2 Fabrication Process 8 2. 3 Summary 13 3. Poly Depletion Effect in 3D NAND Flash Array 14 3. 1 Introduction 14 3. 2 Simulation Results 15 3. 3 Summary 19 4. Effect of the Variation of Gate Dimensions on Program Characteristics in 3D NAND Flash Array 20 4. 1 Introduction 20 4. 2 Simulation Results 21 4. 3 Summary 29 5. Fabrication of poly-Si Channel Stacked Array 30 5. 1 Introduction 30 5. 2 Fabrication Process 31 5. 3 Measurement Results 36 6. Conclusion 41 Bibilography 43 Abstract in Korean 49Maste
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