2 research outputs found
κ±°λμ μλ λ³μλ₯Ό κ³ λ €ν λ€μ€ κ±°λ κ΅λμ μ νμμ λͺ¨λΈ κ°μ
νμλ
Όλ¬Έ (λ°μ¬)-- μμΈλνκ΅ λνμ 곡과λν 건μ€ν경곡νλΆ, 2017. 8. κ³ ν무.μ΄μ©μ€μΈ κ΅λ ꡬ쑰물μ λ
Ένν, κ·Ήνμν©μ λ°λ₯Έ νΌν΄ λ±μΌλ‘ μΈν΄ λΆμ¬μ μ΄νλ₯Ό κ²ͺλλ€. μ¦, κ° λΆμ¬μ νμ±κ³μ, λ¨λ©΄ λμ΄ λ± κ΅¬μ‘° λ³μκ°μ μ€κ³λλ©΄μμ κ·Έκ²κ³Ό λ¬λΌμ§κ² λλ©° κ·Έλ‘ μΈν΄ κ΅λμ ꡬ쑰μ μ±λ₯ λν μ§μμ μΌλ‘ λ³ννλ€. μ΄λ¬ν κ΅λμ μμ νκ³ λΉμ©ν¨μ¨μ μΌλ‘ μ μ§κ΄λ¦¬νκΈ° μν΄μλ ꡬ쑰물μ νμ¬ μ±λ₯μ λν μ νν νκ°κ° μ νλμ΄μΌ νλ€. μ΅κ·Ό κ΅λμ ꡬ쑰 μ±λ₯μ λνλ΄λ κ°κ΄μ μΈ μ§νλ‘μ Load Rating factor(RF)λ₯Ό μ¬μ©νλ κ²½μ°κ° μ¦κ°νκ³ μλ€. RFλ ꡬ쑰물μ ννμ€ν¨κ³Όμ λν λ΄νλ ₯μ λΉμ¨μ μμΉλ‘ λνλΈ κ²μ΄κΈ° λλ¬Έμ, λ€λ₯Έ λ°©μλ€μ λΉν΄ μ λμ μ΄κ³ κ°κ΄μ μ΄λΌλ μ μμ μ°μμ±μ 보μΈλ€. RFλ₯Ό μ ννκ² μ°μ νκΈ° μν ν κ°μ§ λ°©λ²μ μ νμμν΄μμ μ΄μ©νλ κ²μ΄λ€. μ΄λ₯Ό μν΄μλ μ΄κΈ° μ€κ³λμμ κΈ°λ°νμ¬ κ΅λμ μ νμμλͺ¨λΈμ ꡬμ±ν ν, μ΄μ© μ€ κ΅λμ κ±°λμ κ³μΈ‘νμ¬ κ΅λμ νμ¬ μνλ₯Ό λ°μνλλ‘ μ
λ°μ΄νΈν΄μΌ νλ€. μΌλ°μ μΌλ‘ μ νμμλͺ¨λΈ μ
λ°μ΄νΈλ₯Ό μν΄μλ μ°¨λμ¬νμνμ μννλ€. κ·Έλ‘λΆν° κ±°λμ μ²μ§, λ³νλ₯ λ± λΆμ¬λ¨μ μλ΅μ κ³μΈ‘ν ν, μμΉν΄μμΌλ‘λΆν° μ»μ μλ΅κ³Όμ μ€μ°¨κ° μ΅μνλλλ‘ μ νμμλͺ¨λΈμ ꡬ쑰λ³μκ°μ μμ νλ μ΅μ ν κ³Όμ μ κ±°μΉλ€. νμ§λ§ μ΄ λ°©λ²μ 곡μ©μ€μΈ κ΅λμ λν μ λ©΄μ μΈ κ΅ν΅ ν΅μ λ± μ¬ν/κ²½μ μ λΉμ©μ ν¬κ² μꡬνλ€λ λ¨μ μ΄ μλ€. μ΄μ λν λμμΌλ‘ μμμ§λμνμΌλ‘λΆν° μ»μ μ μλ κ³ μ μ§λμ, λͺ¨λνμ λ±μ λμ μλ΅λ§μΌλ‘ μ νμμλͺ¨λΈμ μ
λ°μ΄νΈνλ λ°©λ²λ μλ€. νμ§λ§ μ΄ λ°©λ²μ ν΅ν΄ μ μμ μΈ κ±°λμ λν λλ΅μ μ 보λ₯Ό μ»μ μλ μμ΄λ, λΆμ¬ λ¨μμ κ°μ±μ 보λ₯Ό μ»λ κ²μ νκ³κ° μλ€. νΉν μ νμμν΄μμ ν΅ν΄ RFλ₯Ό μ°μ ν λμλ λΆμ¬λ¨μμ μ νν μ
λ°μ΄νΈκ° μꡬλκΈ° λλ¬Έμ, μμμ§λλ°μ΄ν°λ₯Ό μ΄μ©ν΄ μ
λ°μ΄νΈν λͺ¨λΈλ‘λ νκ³κ° μμμ΄ μ§μ λμ΄ μλ€.
μ΄ λ
Όλ¬Έμ κ΅λμ κ±°λ κ° μλμ μ²μ§ (Relative Girder Displacement, RGD)κ°λ
μ λμ
νμ¬, μμμ§λλ°μ΄ν°λ₯Ό μ΄μ©ν μ νμμλͺ¨λΈ μ
λ°μ΄νΈμ μ νλλ₯Ό ν₯μμν€λ λ°©μμ μ μνλ€. RGDλ λμ λ° μ μ νμ€μ λν΄ κ±°μ λμΌν κ°μ λνλ΄λ©° λΆμ¬λ¨μμ κ°μ± μ 보λ₯Ό μ 곡νκΈ° λλ¬Έμ κΈ°μ‘΄μ νκ³λ₯Ό 극볡ν μ μμ κ²μΌλ‘ μκ°λμλ€. κ·Έλ¦¬κ³ MACκ³Ό μ μ¬νκ² λ²‘ν°λ‘μ νμμ νννλ Relative Girder Displacement Assurance Criterion (RGDAC)κ°λ
μ μ μν¨μΌλ‘μ¨ κ°λ³μ μΈ κ°μΌλ‘ ννλλ RGDμ λ¨μ μ 보μνμλ€. RGDμ RGDACλ₯Ό μ΄μ©νμ¬ λͺ©μ ν¨μλ₯Ό ꡬμ±νλ λ°©μμ λ€μννλ©° κ°κ°μ΄ λͺ¨λΈ μ
λ°μ΄νΈμ λ―ΈμΉλ μν₯μ λΆμν¨μΌλ‘μ¨ λμ λͺ¨λΈμ μ»κΈ° μν΄ κ°μ₯ μ ν©ν λͺ©μ ν¨μ μ€μ λ°©λ²μ μ μνλ€. μ μλ λ°©λ²μ κ²μ¦νκΈ° μν΄ μ€κ΅λμ κΈ°λ°ν κ°μ κ΅λλͺ¨λΈμ ꡬμ±νκ³ λͺ¨λΈ μ
λ°μ΄νΈλ₯Ό μννλ€. μμμ λΆμ¬μ λν΄ κ°μ±μ μ νλ₯Ό κ°μ νκ³ , λ€μν λͺ©μ ν¨μλ₯Ό μ€μ ν΄ μ
λ°μ΄νΈν κ²°κ³Ό μ μνλ λ°©λ²μ μ°μν¨μ λ³΄μΌ μ μμλ€. λν νμ€μ μμΉλ₯Ό λ¬λ¦¬νμ¬ μ
λ°μ΄νΈν¨κ³Όλ₯Ό κ²μ¦ν¨μΌλ‘μ¨ μ μλ λ°©λ²μ μΌλ°μ±μ νμΈνμλ€.
μ μ©μ±μ 보μ΄κΈ° μν μμ λ‘μ μ€ν λ°μ΄ν°λ₯Ό μ΄μ©ν μ€κ΅λμ μ νμμλͺ¨λΈ μ
λ°μ΄νΈλ₯Ό μννλ€. λ μ
λ°μ΄νΈλ λͺ¨λΈμ μ΄μ©νμ¬ RFλ₯Ό μ°μ ν¨μΌλ‘μ¨ μ μλ λ°©λ²μ μ€μ μ μΈ νμ©μ 보μ¬μ£Όμλ€.Bridge in operation experiences deteriorations due to various factors such as aging and damages, and the structural performance of a bridge thus changes continuously over its lifetime. For safe operation and cost-effective maintenance of the bridge, precise evaluation of current performance of the bridge is essential. Recently as an index of the performance of bridge, Load Rating Factor (RF) is regarded as quantitative and objective in comparison with other typically-used methods. RF is usually calculated by finite element (FE) analysis in which a baseline FE model needs to be updated using field measurement which can portray the actual structural behavior. Generally, load testing is conducted in order to update FE model. On the other hand, FE models can also be updated using an ambient vibration data without performing costly load testing. However, But it has a limitation that individual stiffness information of each member or local level, which can affect greatly the accuracy of RF, is difficult to be attained.
This study proposes a new finite element model updating method using ambient vibration data which can enhance the accuracy of updated FE model by adapting Relative Girder Displacement (RGD) and Relative Girder Displacement Accuracy Criterion (RGDAC) concepts. RGD and RGDAC can be regarded as a supplementation to each other because RGD is defined as individual values while RGDAC represents shape with a vector. The two indices are embedded into objective function of optimization in FE model updating procedure, and optimal form of an objective function with RGD and RGDAC is obtained from various numerical simulations. In order to verify the proposed method, a simulated bridge model is created based on an existing bridge. FE model is updated according to proposed method in order that its response becomes closer to that of simulated bridge model. The updated model shows good agreement with simulated bridge model with assumed stiffness deterioration. The generality of the proposed method is confirmed by verifying the results for the cases under various lane load locations. As an illustrative example, FE model for an actual existing bridge is composed and updated by using dynamic displacement data. With the updated FE model, RF is calculated to confirm the proposed method and show its practical application.Chapter 1. Introduction 1
1.1 Research Background 1
1.2 Literature Survey 2
1.3 Research Objectives and Scope 4
1.4 Overview of Dissertation 6
Chapter 2. Finite Element Model Updating using Relative Girder Displacement 7
2.1 Relative Girder Displacement of Multi-girder Bridges 7
2.1.1 Advantage of using the Relative Girder Displacement for Finite Element Model Updating 7
2.1.2 Definition of Relative Girder Displacement 9
2.1.3 Acquisition of the Relative Girder Displacement from Measurement Data 10
2.2 Relative Girder Displacement Index for Updating Finite Element Model 12
2.2.1 Relative Girder Displacement Index 12
2.2.2 Relative Girder Displacement Assurance Criterion 15
2.3 Formulation of the Finite Element Model Updating using Relative Girder Displacement Indices 15
2.3.1 Error Function for Value of Modal and Static Displacement 16
2.3.2 Error Function of the Relative Girder Displacement 18
2.3.3 Error Function of the Relative Girder Displacement Assurance Criterion 19
2.3.4 Objective Function for Updating Finite Element Model 20
2.3.5 Illustrative Example: Error Function of the Relative Girder Displacement 22
2.3.6 Illustrative Example: Error Function of the Relative Girder Displacement Assurance Criterion 26
2.4 Summary 27
Chapter 3. Numerical Evaluation of the Proposed Method 29
3.1 Example using Multi-Girder Bridge Structure 30
3.1.1 General Description of the New Jersey Bridge 30
3.1.2 Sophisticated Finite Element Model of New Jersey Bridge 36
3.2 Baseline Finite Element Model and Simulated Bridge Model 39
3.2.1 Baseline Finite Element Model based on the Sophisticated Finite Element Model 39
3.2.2 Virtual Measurement Data from the Simulated Bridge Model 42
3.3 Finite Element Model Updates through an Optimization Procedure 44
3.3.1 Selection of Optimization Parameters 44
3.3.2 Optimization Algorithm 47
3.4 Comparison of Update Performances of Various Objective Functions 49
3.4.1 Description of Virtual Measurement Data 49
3.4.2 Formulation of Objective Functions 51
3.4.3 Comparison of Structural Responses 53
3.4.4 Evaluation of Load Rating 58
3.5 Update Performance of the Proposed Method for Various Lane Loading Cases 59
3.5.1 Description of Virtual measurement data 59
3.5.2 Formulation of Objective Functions 61
3.5.3 Comparison of Structural Responses 64
3.5.4 Evaluation of Load Rating 69
3.6 Updating the Performance of the Proposed Method for Various Cases of the Girder Stiffness Distribution 71
3.6.1 Description of the Virtual measurement data 71
3.6.2 Formulation of Objective Functions 73
3.6.3 Comparison of Structural Responses 74
3.6.4 Evaluation of Load Rating 76
3.7 Summary 78
Chapter 4. Application Example for a Real Bridge Structure 81
4.1 General Description of Yeondae Bridge 81
4.2 Field Loading Tests 83
4.3 Development of the Baseline Finite Element Model 88
4.4 Finite Element Model Updating Using the Proposed Method 89
4.4.1 Selection of Optimization Parameters 89
4.4.2 Formulation of Objective Functions 92
4.5 Bridge Performance Evaluation 94
4.5.1 Comparison of the Structural Responses 94
4.5.2 Evaluation of Load Rating 97
4.6 Summary 98
Chapter 5. Conclusion 100
References 103
Abstract in Korean 117Docto
Methods for Threshold Voltage Setting of String Select Transistors in Channel Stacked NAND Flash Memory
νμλ
Όλ¬Έ (λ°μ¬)-- μμΈλνκ΅ λνμ 곡과λν μ κΈ°Β·μ»΄ν¨ν°κ³΅νλΆ, 2017. 8. λ°λ³κ΅.Since recent mobile electronic devices such as tablets, laptops, smartphones, or solid-state drives (SSDs) have started to adopt the NAND flash memory as their main data storage device, the demand for low-cost and high-density NAND flash memories has experienced a rapid increase. However, some problems such as the limitations of photolithography technology, cell-to-cell interference, and reduction of the number of electrons stored in floating gates have hindered the downscaling of floating-gate NAND flash memories. To overcome the NAND scaling issues, several types of three-dimensional (3D) stacked charge-trap NAND flash memories, which have been developed based on the bit-cost scalable (BiCS) technology introduced by Toshiba, have been widely investigated, owing to their scalability, ease of fabrication, and coupling-free characteristics.
3D-stacked NAND flash memory architectures can be divided into two categories. The first is the gate-stacked NAND flash memory, in which current flows through a vertical channel while the gates are shared horizontally by all the strings. The second category consists of channel-stacked NAND flash memories, in which the current flows through the horizontally stacked channel and the gates are shared vertically by all the strings. In 3D-stacked NAND flash memory architectures. The channel-stacked type presents several outstanding advantages in terms of minimal unit cell size, bit line (BL) pitch scaling, use of a single-crystalline Si channel by Si/SiGe epitaxial growth process, and degradation characteristics of read currents caused by the increase in the number of stacked layers. However, compared with the gate-stacked type, the channel-stacked type presents critical issues that hinder its use in commercial applications, such as complex array architectures and decoding of the stacked layers. To overcome these problems, our group has recently reported channel-stacked arrays with layer selection by multilevel (LSM) operation. However, the array architecture and operation scheme setting the string select transistors (SSTs) with multilevel states should be simplified further to enable commercialization. In this dissertation, a simplified channel-stacked array with LSM operation is proposed. In addition, new SST threshold voltage (Vth) setting methods to set all the SSTs on each layer to the targeted Vths values are introduced and verified by using technology computer-aided design (TCAD) simulations and measurements in fabricated pseudo-SLSM. Furthermore, various disturbance phenomena that could occur during basic memory operations such as erase, program, and read are analyzed, and schemes for mitigating these disturbances are proposed and verified.Chapter1 Three-Dimensional Stacked NAND Flash Memory 1
1.1 Introduction to Three-Dimensional Stacked NAND Flash Memory 1
1.2 Gate Stack Type NAND Flash Memory 8
1.3 Channel Stack Type NAND Flash Memory 17
1.4 Comparison between Gate Stack Type NAND Flash and Channel Stack Type NAND Flash 24
Chapter2 Channel Stacked NAND Flash Memory with Layer Selection by Multilevel Operation 28
2.1 LSM and Channel Stacked NAND Flash Architecture Design 28
2.2 Operation Scheme of Channel Stacked NAND Flash Memory with LSM 36
2.2.1 Stacked SST Initialization to Enable LSM 36
2.2.2 Read Operation with LSM 38
2.2.3 Program/Erase Operation with LSM 42
2.3 Comparison with Conventional Channel Stacked NAND Flash Memory Architecture 47
Chapter3 Methods for Setting String Select Transistors for Layer Selection in Channel Stacked NAND Flash Memory 50
3.1 Method for Setting SST Vth Using One Erase Operation 50
3.2 Method for Setting SST Vth Using Dummy SSTs 60
Chapter4 Reliability Issues During LSM in Channel Stacked NAND Flash Memory 69
4.1 Program Disturbance in SLSM 69
4.2 Read Disturbance in SLSM 84
Chapter5 Application to General NAND Flash Memory 95
Chapter6 Conclusions 103
Bibliography 106
Abstract in Korean 119Docto