Ischemic stroke as a rare cause of seizures in a newborn – case report

Background: Identifying etiology of seizures is the primary clinical objective in the management of neonatal seizures (NS). About 85 % of NS cases occurr as a consequence of a specific, identifiable etiology. Causes of symptomatic NS can be broadly categorized as: hypoxic-ischemic encephalopathy, electrolyte or metabolic disturbances, CNS or systemic infections, developmental defects and acquired structural brain lesions, including hemorrhagic or ischemic stroke. Ischemic stroke is characterized as a sudden focal or generalized brain function disruption, whose symptoms tend to last longer than 24 hours (or cause death) and have no other reason but a vascular one. The reported annual incidence is estimated at one per 4000 live births for neonates. The aim of this case report is to present diagnostic difficulties in case of ischemic stroke in apparently healthy neonate. This case concerns a patient – a full-term male newborn, who was in a good condition in the first 3 days after birth. At the beginning of the 4th day of life 3 episodes of right-sided clonic seizures with right-sided nystagmus occurred and which was the reason for admitting the patient to the Department of Neonate and Infant Pathology. Shortly after arrival the seizures appeared again. Laboratory tests showed slightly lowered glucose level and elevated serum concentration of lactic acid. The ultrasound examination of the head revealed a small right-sided subependymal cyst. The patient’s condition was deteriorating, with recurring righ-sided clonic and tonic seizures accompanied by apnea and desaturation that required resuscitation efforts. Because of worsening state of the patient, CT scan was performed. The CT examination revealed a hypodensic area in the left parietal region and cerebral edema, which indicated a possible ischemic stroke. Conclusions: The absence of visible pathologies in the ultrasound examination of the head does not necessarily indicate a lack of CSN abnormalities. More precise imaging tests are needed to identify the cause of NS

Investigations of TiO₂, Ti/TiO₂, and Ti/TiO₂/Ti/TiO₂ coatings produced by ALD and PVD methods on Mg-(Li)-Al-RE alloys substrates

Magnesium alloys have recently become increasingly popular in many sectors of the industry due to their unique properties, such as low density, high specific strength, vibration damping ability along with their recyclability and excellent machinability. Nowadays, thin films have been attracting more attention in applications that improve mechanical and corrosion properties. The following alloys were used for the coated Mg-Al-RE and the ultra-light magnesium-lithium alloy of the Mg-Li-Al-RE type. A single layer of TiO2 was deposited using the atomic layer deposition ALD method. Multiple layers of the Ti/TiO₂ and Ti/TiO₂/Ti/TiO₂ type were obtained by the MS-PVD magnetron sputtering technique. Samples were investigated by scanning and a transmission electron microscope (SEM, TEM) and their morphology was studied by an atomic forces microscope (AFM). Further examinations, including electrochemical corrosion, roughness and tribology, were also carried out. As a result of the research, it was found that the best electrochemical properties are exhibited by single TiO2 layers obtained by the ALD method. Moreover, it was found that the Ti/TiO₂/Ti/TiO₂ double film has better properties than the Ti/TiO₂ film