Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 × 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Ångström oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat. © 2003 Elsevier Science B.V. All rights reserved

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions