Numerical Studies of a Confocal Resonator Pick-Up with FEMLAB

Diagnostic devices aimed at measuring beam profiles in high intensity accelerators are often perturbed by microwave fields generated by the beam itself upstream of the detection device, which propagate inside the vacuum pipe. These parasitic waveguide modes can significantly reduce the signal-to-noise ratio and thus the sensitivity of the beam monitor. This warrants investigation of detection devices that are sensitive to the direct electromagnetic fields of the beam, but largely ignore the parasitic waveguide modes. A new pick-up based on a confocal resonator configuration situated transversely to the direction of propagation of the beam is currently under development at Uppsala University, Sweden. Since a confocal resonator can have a high quality factor for the diffraction losses, then reciprocity suggests that it only couples weakly to external fields while keeping anyway a significant coupling to the direct fields of the beam. Numerical simulations were performed with FEMLAB to better characterize the electromagnetic properties of a confocal resonator pick-up to be operated in the multi-GHz range, especially in terms of eigen-frequencies and coupling to external electromagnetic fields. Our results were then compared to analytical predictions and a good agreement was found, despite a few limitations in the computation of the resonant modes. Having recently built a first confocal resonator prototype, we also performed experimental cross-checks of our numerical studies with a microwave network analyzer. Our results are presented in detail in this report and we discuss further applications of the confocal resonator microwave pick-up

Helicity sensitive terahertz radiation detection by field effect transistors

Terahertz light helicity sensitive photoresponse in GaAs/AlGaAs high electron mobility transistors. The helicity dependent detection mechanism is interpreted as an interference of plasma oscillations in the channel of the field-effect-transistors (generalized Dyakonov-Shur model). The observed helicity dependent photoresponse is by several orders of magnitude higher than any earlier reported one. Also linear polarization sensitive photoresponse was registered by the same transistors. The results provide the basis for a new sensitive, all-electric, room-temperature and fast (better than 1 ns) characterisation of all polarization parameters (Stokes parameters) of terahertz radiation. It paves the way towards terahertz ellipsometry and polarization sensitive imaging based on plasma effects in field-effect-transistors.Comment: 7 pages, 4 figure

Terahertz Techniques in NDE

So far, terahertz measurement technology has rarely been used in industry. This book chapter presents therefore the underlying technologies, the resulting possibilities and exemplary applications. The introduction describes the basic properties of terahertz systems and the advantages of terahertz technology over established techniques such as infrared, X-rays and ultrasound. The two industrially relevant terahertz techniques, time domain spectrometer and FMCW system, are described in detail. In addition, the metrological basics for their main applications are introduced. Imaging is required in many applications. Different approaches are presented. Before the chapter concludes with an outlook on future applications, current application examples are discussed. This concerns appli cations in the fields of coating thickness measurement, safety, materials research, testing of lightweight materials and inline testing. An extensive reference list provides a deeper insight into the topics addressed