Variation Resilient Adaptive Controller for Subthreshold Circuits

Subthreshold logic is showing good promise as a viable ultra-low-power circuit design technique for power-limited applications. For this design technique to gain widespread adoption, one of the most pressing concerns is how to improve the robustness of subthreshold logic to process and temperature variations. We propose a variation resilient adaptive controller for subthreshold circuits with the following novel features: new sensor based on time-to-digital converter for capturing the variations accurately as digital signatures, and an all-digital DC-DC converter incorporating the sensor capable of generating an operating operating Vdd from 0V to 1.2V with a resolution of 18.75mV, suitable for subthreshold circuit operation. The benefits of the proposed controller is reflected with energy improvement of up to 55% compared to when no controller is employed. The detailed implementation and validation of the proposed controller is discussed

Subthreshold Dual Mode Logic

In this brief, we introduce a novel low-power dual mode logic (DML) family, designed to operate in the subthreshold region. The proposed logic family can be switched between static and dynamic modes of operation according to system requirements. In static mode, the DML gates feature very low-power dissipation with moderate performance, while in dynamic mode they achieve higher performance, albeit with increased power dissipation. This is achieved with a simple and intuitive design concept. SPICE and Monte Carlo simulations compare performance, power dissipation, and robustness of the proposed DML gates to their CMOS and domino counterparts in the 80-nm process. Measurements of an 80-nm test chip are presented in order to prove the proposed concept

A PROPOSED DUAL SIZE DESIGN FOR ENERGY MINIMIZATION IN SUB-THRESHOLD CIRCUITS

Sub-threshold operation has received a lot of attention in limited performance applications.However, energy optimization of sub-threshold circuits should be performed with the concern of the performance limitation of such circuit. In this paper, a dual size design is proposed for energy minimization of sub-threshold CMOS circuits. The optimal downsizing factor is determined and assigned for some gates on the off-critical paths to minimize the energy at the maximum allowable performance. This assignment is performed using the proposed slack based genetic algorithm which is a heuristic-mixed evolutionary algorithm. Some gates are heuristically assigned to the original and the downsized design based on their slack time determined by static timing analysis. Other gates are subjected to the genetic algorithm to perform an optimal downsizing assignment taking into account the previous assignments. The algorithm is applied for different downsizing factors to determine the optimal dual size for low energy operation without a performance degradation. Experimental results are obtained for some ISCAS-85 benchmark circuits such as 74283, 74L85, ALU74181, and 16 bit ripple carry adder. The proposed design shows an energy per cycle saving ranged from (29.6% to 56.59%) depending on the utilization of available slack time from the off-critical paths

Quantifying Near-Threshold CMOS Circuit Robustness

In order to build energy efficient digital CMOS circuits, the supply voltage must be reduced to near-threshold. Problematically, due to random parameter variation, supply scaling reduces circuit robustness to noise. Moreover, the effects of parameter variation worsen as device dimensions diminish, further reducing robustness, and making parameter variation one of the most significant hurdles to continued CMOS scaling. This paper presents a new metric to quantify circuit robustness with respect to variation and noise along with an efficient method of calculation. The method relies on the statistical analysis of standard cells and memories resulting an an extremely compact representation of robustness data. With this metric and method of calculation, circuit robustness can be included alongside energy, delay, and area during circuit design and optimization

Ultra-low Voltage Digital Circuits and Extreme Temperature Electronics Design

Certain applications require digital electronics to operate under extreme conditions e.g., large swings in ambient temperature, very low supply voltage, high radiation. Such applications include sensor networks, wearable electronics, unmanned aerial vehicles, spacecraft, and energyharvesting systems. This dissertation splits into two projects that study digital electronics supplied by ultra-low voltages and build an electronic system for extreme temperatures. The first project introduces techniques that improve circuit reliability at deep subthreshold voltages as well as determine the minimum required supply voltage. These techniques address digital electronic design at several levels: the physical process, gate design, and system architecture. This dissertation analyzes a silicon-on-insulator process, Schmitt-trigger gate design, and asynchronous logic at supply voltages lower than 100 millivolts. The second project describes construction of a sensor digital controller for the lunar environment. Parts of the digital controller are an asynchronous 8031 microprocessor that is compatible with synchronous logic, memory with error detection and correction, and a robust network interface. The digitial sensor ASIC is fabricated on a silicon-germanium process and built with cells optimized for extreme temperatures

Variability-Aware Design of Subthreshold Devices

Over the last 10 years, digital subthreshold logic circuits have been developed for applications in the ultra-low power design domain, where performance is not the priority. Recently, devices optimized for subthreshold operation have been introduced as potential construction blocks. However, for these devices, a strong sensitivity to process variations is expected due to the exponential relationship of the subthreshold drive current and the threshold voltage. In this thesis, a yield optimization technique is proposed to suppress the variability of a device optimized for subthreshold operation. The goal of this technique is to construct and inscribe a maximum yield cube in the 3-D feasible region composed of oxide thickness, gate length, and channel doping concentration. The center of this cube is chosen as the maximum yield design point with the highest immunity against variations. By using the technique, a transistor is optimized for subthreshold operation in terms of the desired total leakage current and intrinsic delay bounds. To develop the concept of the technique, sample devices are designed for 90nm and 65nm technologies. Monte Carlo simulations verify the accuracy of the technique for meeting power and delay constraints under technology-specific variances of the design parameters of the device