Bayesian macromodeling for circuit level QCA design

We present a probabilistic methodology to model and abstract the behavior of quantum-dot cellular automata circuit(QCA) at “ circuit level” above the current practice of layout level. These macromodels provide input-output relationship of components (a set of QCA cells emulating a logical function) that are faithful to the underlying quantum effects. We show the macromodeling of a few key circuit components in QCA circuit, such as majority logic, lines, wire-taps, cross-overs, inverters, and corners. In this work, we demostrate how we can make use of these macromodels to abstract the logical function of QCA circuits and to extract crucial device level characteristics such as polarization and low-energy error state configurations by circuit level Bayesian model, accurately accounting for temperature and other device level parameters. We also demonstrate how this macromodel based design can be used effectively in analysing and isolating the weak spots in the design at circuit level itself

Hierarchical probabilistic macromodeling for QCA circuits

With the goal of building an hierarchical design methodology for quantum-dot cellular automata (QCA) circuits, we put forward a novel, theoretically sound, method for abstracting the behavior of circuit components in QCA circuit, such as majority logic, lines, wire-taps, cross-overs, inverters, and corners, using macromodels. Recognizing that the basic operation of QCA is probabilistic in nature, we propose probabilistic macromodels for standard QCA circuit elements based on conditional probability characterization, defined over the output states given the input states. Any circuit model is constructed by chaining together the individual logic element macromodels, forming a Bayesian network, defining a joint probability distribution over the whole circuit. We demonstrate three uses for these macromodel-based circuits. First, the probabilistic macromodels allow us to model the logical function of QCA circuits at an abstract level - the "circuit" level - above the current practice of layout level in a time and space efficient manner. We show that the circuit level model is orders of magnitude faster and requires less space than layout level models, making the design and testing of large QCA circuits efficient and relegating the costly full quantum-mechanical simulation of the temporal dynamics to a later stage in the design process. Second, the probabilistic macromodels abstract crucial device level characteristics such as polarization and low-energy error state configurations at the circuit level. We demonstrate how this macromodel-based circuit level representation can be used to infer the ground state probabilities, i.e., cell polarizations, a crucial QCA parameter. This allows us to study the thermal behavior of QCA circuits at a higher level of abstraction. Third, we demonstrate the use of these macromodels for error analysis. We show that low-energy state configurations of the macromodel circuit match those of the layout level, thus allowing us to isolate weak p- oints in circuits design at the circuit level itsel

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results