Design of variability compensation architectures of digital circuits with adaptive body bias

The most critical concern in circuit is to achieve high level of performance with very tight power constraint. As the high performance circuits moved beyond 45nm technology one of the major issues is the parameter variation i.e. deviation in process, temperature and voltage (PVT) values from nominal specifications. A key process parameter subject to variation is the transistor threshold voltage (Vth) which impacts two important parameters: frequency and leakage power. Although the degradation can be compensated by the worstcase scenario based over-design approach, it induces remarkable power and performance overhead which is undesirable in tightly constrained designs. Dynamic voltage scaling (DVS) is a more power efficient approach, however its coarse granularity implies difficulty in handling fine grained variations. These factors have contributed to the growing interest in power aware robust circuit design. We propose a variability compensation architecture with adaptive body bias, for low power applications using 28nm FDSOI technology. The basic approach is based on a dynamic prediction and prevention of possible circuit timing errors. In our proposal we are using a Canary logic technique that enables the typical-case design. The body bias generation is based on a DLL type method which uses an external reference generator and voltage controlled delay line (VCDL) to generate the forward body bias (FBB) control signals. The adaptive technique is used for dynamic detection and correction of path failures in digital designs due to PVT variations. Instead of tuning the supply voltage, the key idea of the design approach is to tune the body bias voltage bymonitoring the error rate during operation. The FBB increases operating speed with an overhead in leakage power

Subthreshold circuits: Design, implementation and application

Digital circuits operating in the subthreshold region of the transistor are being used as an ideal option for ultra low power complementary metal-oxide-semiconductor (CMOS) design. The use of subthreshold circuit design in cryptographic systems is gaining importance as a counter measure to power analysis attacks. A power analysis attack is a non-invasive side channel attack in which the power consumption of the cryptographic system can be analyzed to retrieve the encrypted data. A number of techniques to increase the resistance to power attacks have been proposed at algorithmic and hardware levels, but these techniques suffer from large area and power overheads. The main aim of this research is to understand the viability of implementing subthreshold systems for cryptographic applications. Standard cell libraries in subthreshold are designed and a methodology to identify the minimum energy point, aspect ratio, frequency range and operating voltage for CMOS standard cells is defined. As scalar multiplication is the fundamental operation in elliptic curve cryptographic systems, a digit-level gaussian normal basis (GNB) multiplier is implemented using the aforementioned standard cells. A similar standard-cell library is designed for the multiplier to operate in the superthreshold regime. The subthreshold and superthreshold multipliers are then subjected to a differential power analysis attack. Power performance and signal-to-noise ratio (SNR) of both these systems are compared to evaluate the usefulness of the subthreshold design. The power consumption of the subthreshold multiplier is 4.554 uW, the speed of the multiplier is 65.1 KHz and the SNR is 40 dB. The superthreshold multiplier has a power consumption of 4.005 mW, the speed of the multiplier is 330 MHz and the SNR is 200 dB. Reduced power consumption, hence reduced SNR, increases the resistance of the subthreshold multiplier against power analysis attacks. (Refer to PDF for exact formulas)

Implementation of dual stack technique for reducing leakage and dynamic power

This paper deals with proposal of a new dual stack approach for reducing both leakage and dynamic powers. The development of digital integrated circuits is challenged by higher power consumption. Thecombination of higher clock speeds, greater functional integration, and smaller process geometries has contributed to significant growth in power density. Scaling improves transistor density and functionality ona chip. Scaling helps to increase speed and frequency of operation and hence higher performance. As voltages scale downward with the geometries threshold voltages must also decrease to gain the performance advantages of the new technology but leakage current increases exponentially. Today leakage power has become anincreasingly important issue in processor hardware and software design. It can be used in various applications like digital VLSI clocking system, buffers, registers, microprocessors etc. The leakage power increases astechnology is scaled down. In this paper, we propose a new dual stack approach for reducing both leakage and dynamic powers. Moreover, the novel dual stack approach shows the least speed power product whencompared to the existing methods. All well known approach is “Sleep” in this method we reduce leakage power. The proposed Dual Stack approach we reduce more power leakage. Dual Stack approach uses theadvantage of using the two extra pull-up and two extra pull-down transistors in sleep mode either in OFF state or in ON state. Since the Dual Stack portion can be made common to all logic circuitry, less number of transistors is needed to apply a certain logic circuit.The dual stack approach shows the least speed power product among all methods. The Dual Stack technique provides new ways to designers who require ultra-low leakage power consumption with much less speedpower product

Stochastic-Based Computing with Emerging Spin-Based Device Technologies

In this dissertation, analog and emerging device physics is explored to provide a technology platform to design new bio-inspired system and novel architecture. With CMOS approaching the nano-scaling, their physics limits in feature size. Therefore, their physical device characteristics will pose severe challenges to constructing robust digital circuitry. Unlike transistor defects due to fabrication imperfection, quantum-related switching uncertainties will seriously increase their susceptibility to noise, thus rendering the traditional thinking and logic design techniques inadequate. Therefore, the trend of current research objectives is to create a non-Boolean high-level computational model and map it directly to the unique operational properties of new, power efficient, nanoscale devices. The focus of this research is based on two-fold: 1) Investigation of the physical hysteresis switching behaviors of domain wall device. We analyze phenomenon of domain wall device and identify hysteresis behavior with current range. We proposed the Domain-Wall-Motion-based (DWM) NCL circuit that achieves approximately 30x and 8x improvements in energy efficiency and chip layout area, respectively, over its equivalent CMOS design, while maintaining similar delay performance for a one bit full adder. 2) Investigation of the physical stochastic switching behaviors of Mag- netic Tunnel Junction (MTJ) device. With analyzing of stochastic switching behaviors of MTJ, we proposed an innovative stochastic-based architecture for implementing artificial neural network (S-ANN) with both magnetic tunneling junction (MTJ) and domain wall motion (DWM) devices, which enables efficient computing at an ultra-low voltage. For a well-known pattern recognition task, our mixed-model HSPICE simulation results have shown that a 34-neuron S-ANN implementation, when compared with its deterministic-based ANN counterparts implemented with digital and analog CMOS circuits, achieves more than 1.5 ~ 2 orders of magnitude lower energy consumption and 2 ~ 2.5 orders of magnitude less hidden layer chip area

Robust Circuit Design for Low-Voltage VLSI.

Voltage scaling is an effective way to reduce the overall power consumption, but the major challenges in low voltage operations include performance degradation and reliability issues due to PVT variations. This dissertation discusses three key circuit components that are critical in low-voltage VLSI. Level converters must be a reliable interface between two voltage domains, but the reduced on/off-current ratio makes it extremely difficult to achieve robust conversions at low voltages. Two static designs are proposed: LC2 adopts a novel pulsed-operation and modulates its pull-up strength depending on its state. A 3-sigma robustness is guaranteed using a current margin plot; SLC inherently reduces the contention by diode-insertion. Improvements in performance, power, and robustness are measured from 130nm CMOS test chips. SRAM is a major bottleneck in voltage-scaling due to its inherent ratioed-bitcell design. The proposed 7T SRAM alleviates the area overhead incurred by 8T bitcells and provides robust operation down to 0.32V in 180nm CMOS test chips with 3.35fW/bit leakage. Auto-Shut-Off provides a 6.8x READ energy reduction, and its innate Quasi-Static READ has been demonstrated which shows a much improved READ error rate. A use of PMOS Pass-Gate improves the half-select robustness by directly modulating the device strength through bitline voltage. Clocked sequential elements, flip-flops in short, are ubiquitous in today’s digital systems. The proposed S2CFF is static, single-phase, contention-free, and has the same number of devices as in TGFF. It shows a 40% power reduction as well as robust low-voltage operations in fabricated 45nm SOI test chips. Its simple hold-time path and the 3.4x improvement in 3-sigma hold-time is presented. A new on-chip flip-flop testing harness is also proposed, and measured hold-time variations of flip-flops are presented.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/111525/1/yejoong_1.pd

Design of a process monitor and of peripheral circuits enabling the characterisation of CMOS 45nm Ultra Low Power and Litho Friendly optimised standard cells

L’evoluzione della tecnologia CMOS è caratterizzata dallo scaling delle dimensioni dei dispositivi e dalla riduzione del consumo di potenza. Dal momento che le difficoltà di realizzazione aumentano al diminuire delle dimensioni, nei nodi tecnologici più recenti la velocità del processo di scaling sta diminuendo. Uno dei maggiori problemi causati dalla riduzione delle dimensioni dei dispositivi è la variabilità del processo di fabbricazione. L’obiettivo di questo progetto è quello di ridurre gli effetti che la variabilità del processo di realizzazione nel nodo tecnologico CMOS 45 nm ha sulle prestazioni della logica digitale, grazie a metodi di design non convenzionali. In questo progetto è stato realizzato un testchip per studiare e quantificare i vantaggi, in termini di prestazioni, ottenuti tramite la progettazione di librerie standard-like ottimizzate secondo canoni di litho-friendliness (LF) e ultra low power (ULP). Le standard cells LF utilizzano layout estremamente regolari. Le standard cells ULP sono progettate per operare con tensioni di alimentazioni notevolmente ridotte. Il fine principale del testchip sta nell’ottenere una panoramica della variabilità locale e globale di parametri significativi nella progettazione digitale: ad esempio la frequenza di lavoro e il consumo di potenza. Inoltre, nel testchip sono stati realizzati alcuni circuiti originali per il monitoraggio della qualità del processo di fabbricazione. The evolution of the CMOS technology is characterized by the scaling of transistors size and by the reduction of their power dissipation. In the last technology nodes the speed of the scaling process is decreasing, since the complexity of the technology increases with its size reduction. One of the main issues caused by the shrinking of the transistor size is the variability of the fabrication process. The target of this project is to reduce the effects of the variability of the realisation process in a CMOS 45 nm technology node in digital circuits performances, using unconventional design methods. A testchip is realised in this project to investigate and to quantify the improvement of the circuit performances obtained through the design of dedicated litho-friendly (LF) and of the Ultra Low Power (ULP) standard-like libraries. The LF standard cells libraries are optimised for lithography using ultra regular layout styles. The ULP standard cells library is optimised to operate at extremely low supply voltage. The main aim of the testchip is to get insight into the local and the global variability of relevant parameters for digital design, such as operating frequency and power consumption. In this testchip some structures are also included, to develop some innovative circuits that should help to monitor the quality of the technology process

High performance CMOS amplifier and phase-locked loop design

Low voltage, high speed and high linearity are three different aspects of the analog circuit performance that designers are trying to achieve. In this dissertation, three design projects targeting these different performance optimizations are introduced.;The first work is a design of a low voltage operational amplifier. In this work, a threshold voltage tuning technique for low voltage CMOS analog circuit design is presented. A 750mV operational amplifier using this technique was designed in a 0.5mum 5V CMOS process with Vtp ≈ -0.9V and Vtn ≈ 0.8V. The active area is 560mum x 760mum. It exhibits a 62dB DC gain and consumes 38muW of power. It works with supply voltages from 0.75V to 1V. Compared to its 5V counterpart consuming the same amount of current, it maintains nearly the same gain bandwidth product of 3.7MHz. This op amp is the FIRST strong inversion op amp that works at a supply voltage below the threshold voltage.;The second is a design of a high speed phase-locked loop for data recovery. A new non-sequential linear phase detector is introduced in this work. Most of the existing phase detectors for data recovery are based on state-machines. The performance of these structures deteriorates rapidly at higher frequencies because of the inadequate settling performance of the flip-flop used to form the state machine. The new phase detector has a speed advantage over the state-machine based designs because it is simple and easy to implement in CMOS technology. Using this phase detector, a PLL was designed in a 0.25mum CMOS process with an active area of 400mum x 290mum. Experimental results show it successfully locks to a 2.1Gbit/s pseudo-random data sequence at 2.3V. It is believed that the architecture is the fastest that has been introduced for data recovery applications.;The third work introduces the design of a highly-linear variable gain amplifier. It achieves high linearity with third harmonic distortion better than -60dB Vopp = 1V at 160MHz in a 0.25mum CMOS process. It has a precise gain step of 6.02dB that is controlled digitally. The linearity performance is achieved with a linearized open loop amplifier configuration. Similar performance could only be achieved using feedback configuration before

Robust low-power digital circuit design in nano-CMOS technologies

Device scaling has resulted in large scale integrated, high performance, low-power, and low cost systems. However the move towards sub-100 nm technology nodes has increased variability in device characteristics due to large process variations. Variability has severe implications on digital circuit design by causing timing uncertainties in combinational circuits, degrading yield and reliability of memory elements, and increasing power density due to slow scaling of supply voltage. Conventional design methods add large pessimistic safety margins to mitigate increased variability, however, they incur large power and performance loss as the combination of worst cases occurs very rarely. In-situ monitoring of timing failures provides an opportunity to dynamically tune safety margins in proportion to on-chip variability that can significantly minimize power and performance losses. We demonstrated by simulations two delay sensor designs to detect timing failures in advance that can be coupled with different compensation techniques such as voltage scaling, body biasing, or frequency scaling to avoid actual timing failures. Our simulation results using 45 nm and 32 nm technology BSIM4 models indicate significant reduction in total power consumption under temperature and statistical variations. Future work involves using dual sensing to avoid useless voltage scaling that incurs a speed loss. SRAM cache is the first victim of increased process variations that requires handcrafted design to meet area, power, and performance requirements. We have proposed novel 6 transistors (6T), 7 transistors (7T), and 8 transistors (8T)-SRAM cells that enable variability tolerant and low-power SRAM cache designs. Increased sense-amplifier offset voltage due to device mismatch arising from high variability increases delay and power consumption of SRAM design. We have proposed two novel design techniques to reduce offset voltage dependent delays providing a high speed low-power SRAM design. Increasing leakage currents in nano-CMOS technologies pose a major challenge to a low-power reliable design. We have investigated novel segmented supply voltage architecture to reduce leakage power of the SRAM caches since they occupy bulk of the total chip area and power. Future work involves developing leakage reduction methods for the combination logic designs including SRAM peripherals